Application Report

SWRA370

– August 2011

Basic RF Testing of CCxxxx Devices

Abhishek Chattopadhyay

ABSTRACT

This document presents users of Texas Instruments' low-power RF products with an overview of the

different characterization tests (conducted, not radiated) that are performed during the device verification

process. The document covers the basic setup of the test system and gives procedural information about

each test.

Throughout this document, the term CCxxxx refers to the low-power CC25xx, CC11xx, CC10XX, and

CC24xx RF device families.

Keywords:

•

RF Testing

•

RX Test

•

Conformance Testing

•

Output Power

•

SmartRF Studio

•

TX Test

•

Characterization Test

•

Sensitivity

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SWRA370

– August 2011

Basic RF Testing of CCxxxx Devices

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