Any board with

TI LPRF

Radio

USB MCU

PC

Windows OS

CEBAL

USB Driver

SmartRF Studio/

LabVIEW

CEBAL Firmware

USB

Cable

SmartRF Evaluation Board or

CC Debugger

Note (1)

Standards and System Requirements

www.ti.com

It is possible to connect your own hardware to the SmartRF Evaluation Board to test your own radio

design with SmartRF Studio7/LabVIEW. Connect the board to the TI evaluation board via the breakout

pins on the EB, or use the target connector on the CC Debugger. For SoCs, use the debug interface; for

transceivers, use the serial peripheral interface (SPI). Figure 2 shows the connection between a PC and a

generic evaluation board with a TI LPRF radio.

(1)

Connect the board to the TI evaluation board via the break-out pins on the board, or user the target

connector on the CC Debugger. For SoCs, use the debug interface; for transceivers, use the SPI interface.

Refer to the evaluation board user guide for more details.

Figure 2. Interface Between PC and Any Board with TI LPRF Radio

In all cases, make sure that the boards are properly connected and that the voltage levels are correct.

These cautions are especially relevant if you are not using level shifters and the voltage level on your

board is different from the voltage level on the EB (usually 3.3 V). For more information, see Ref. 11 and

Ref. 12.

CAUTION

The CC Debugger operates internally at 3.3 V. However, it has level converters

that will detect the voltage on the target board and ensure that the debug

control lines are set to a voltage that corresponds to the target I/O voltage.

2.3.4

Test System Operation

Use these general parameters to perform tests in TX mode when using LabVIEW:

•

Set the DUT to TX mode using SmartRF Studio 7.

•

Supply and temperature are set by LabVIEW.

•

The signal analyzer is configured by LabVIEW to measure the transmitted data.

•

LabVIEW captures the data from the signal analyzer.

•

The collected information then can be interpreted either in LabVIEW or other PC-based software.

8

Basic RF Testing of CCxxxx Devices

SWRA370

– August 2011

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© 2011, Texas Instruments Incorporated