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Standards and System Requirements

2

Standards and System Requirements

2.1

Standards

The following standards serve as references for the tests described in this document. All electronic links

are current at the time of document publication.

•

•

•

Zigbee Standard

•

FCC, Section 47CFR15

– Part 15 Standard

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ETSI EN 300 440 Standard

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ETSI EN 300 220 Standard

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IEEE 802.15.4 Standard

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ARIB T-66 Standard

2.2

Test Equipment Suppliers

The different test equipment used to perform the various procedures described in this document can be

procured from the following suppliers. Obtaining some of this equipment may require going through an

agent. All electronic links are current at the time of document publication.

•

Rohde

& Schwarz

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Agilent

•

Anritsu

•

Tektronix

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Test Equity

•

National Instruments

2.3

Test System Requirements

Any characterization test system has some generic components and additional specialty engineering

customization. A typical test system generally consists of these components and subsystems:

•

Signal analyzers (spectrum analyzers): These tools are widely used to measure the frequency

response, noise, and distortion characteristics of all types of RF circuitry. These devices compare the

input and output spectra under a variety of conditions. A typical test system usually requires only one

signal analyzer.

•

Signal generators: These devices generate repeating or non-repeating electronic signals (in either the

analog or digital domain). A typical system should have at least two signal generators: one to generate

the primary signal, the second to generate an interference signal. The CC devices from TI can be used

as a signal source in some lab setups. However, the power resolution may not be as good as that

produced by a signal generator.

•

Temperature chamber: An enclosure used to test the effects of specified temperature conditions on a

series of test devices. A single temperature chamber should be sufficient for most test systems.

•

Connectors/cables/splitters: These components connect different signals using coaxial cable from

the test system to (and from) the device under test (DUT).

•

LabVIEW

™: LabVIEW, or Laboratory Virtual Instrumentation Engineering Workbench, is a software

platform and development environment for a visual programming language from National Instruments.

is commonly used for data acquisition, instrument control, and industrial automation on a variety of

software is used as a platform to automate the entire test system.

•

SmartRF

™ Studio: SmartRF Studio (see Ref. 10) is a Windows-based application that can be used to

evaluate and configure low-power RF ICs from Texas Instruments. This tool helps RF system

designers to quickly and easily evaluate the respective devices at an early stage in the design process.

It is especially useful for generation of configuration register values, for practical testing of the RF

5

SWRA370

– August 2011

Basic RF Testing of CCxxxx Devices

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