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SWRA370 Datasheet(PDF) 9 Page - Texas Instruments

Part # SWRA370
Description  Basic RF Testing of CCxxxx Devices
PDF  34 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

SWRA370 Datasheet(HTML) 9 Page - Texas Instruments

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f
=
CARRIER
· FREQ[23:0]
f
2
XOSC
16
(
f
2
XOSC
16
www.ti.com
Frequency Correction
Use these general parameters to perform tests in RX mode when using LabVIEW:
•
Set the DUT to RX mode using SmartRF Studio 7.
•
Supply/temperature are set by LabVIEW.
•
The signal analyzer is configured by LabVIEW to transmit data continuously or in packets that adhere
to standards.
•
SmartRF Studio 7/LabVIEW captures the data from the DUT.
•
This collected information then can be interpreted either in LabVIEW or exported to other PC-based
software.
3
Frequency Correction
Electronic circuits often use the mechanical resonance of a vibrating piezoelectric crystal to create an
electrical signal with a very precise frequency. This frequency is commonly used to provide a stable clock
signal for digital integrated circuits and to stabilize frequencies for radio transmitters and receivers.
Environmental changes in temperature, humidity, pressure, and external vibration can change the
resonant frequency of a crystal. The age of a crystal also adds inaccuracies to the crystal over time.
Because there is always some inaccuracy in the crystals used with radios, one way to correct for this error
is required in order to obtain an accurate measurement of sensitivity and other parameters.
The carrier frequency in the chip is mathematically related to the crystal frequency. For example, for the
CC2500 the carrier frequency is calculated as shown by Equation 1:
(1)
Where FREQ[23:0] is the base frequency for the frequency synthesizer in increments of
However, the actual crystal frequency is not the same as the stated crystal frequency as a result of the
inaccuracies noted earlier. Consequently, we must calculate the actual crystal frequency.
After putting the device into unmodulated, continuous TX mode with the settings found using SmartRF
Studio, use a spectrum analyzer to measure the exact carrier frequency coming out of the chip.
This measured frequency is then put into Equation 1 from the product data sheet, and one solves for f
XOSC.
This result is the actual crystal frequency for the specific DUT that can then be used to determine the
exact carrier frequency across the band.
In the CC253x/CC254x devices, the FREQTUNE register is used to tune the crystal oscillator. The default
setting '1111' leaves the XOSC not tuned. Changing the setting from default switches in extra capacitance
to the oscillator, effectively lowering the XOSC frequency. As a result, the final crystal frequency can be
controlled by adjusting the value of the FREQTUNE register in these devices.
9
SWRA370
– August 2011
Basic RF Testing of CCxxxx Devices
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Copyright
© 2011, Texas Instruments Incorporated



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