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SWRA370 Datasheet(PDF) 6 Page - Texas Instruments |
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SWRA370 Datasheet(HTML) 6 Page - Texas Instruments |
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6 / 34 page ![]() Standards and System Requirements www.ti.com system, and for finding optimized external component values. SmartRF Studio can be used either as a standalone application or together with some evaluation boards that are shipped in RF IC development kits. • Network analyzer (vector network analyzer): This tool is an instrument that measures the network parameters of electrical networks. Contemporary network analyzers usually measure s- parameters because reflection and transmission of electrical networks are easy to measure at high frequencies, but there are other network parameter sets such as y-parameters, z-parameters, and h-parameters. Network analyzers are often used to characterize two-port networks such as amplifiers and filters; they can also be used on networks with an arbitrary number of ports. It is useful to have one network analyzer available. • Oscilloscope: This electronic test instrument allows users to observe constantly varying signal voltages, usually as a two-dimensional graph of one or more electrical potential differences with a vertical or Y axis, plotted as a function of time (horizontal or x axis). Although an oscilloscope displays voltage on the vertical axis, any other quantity that can be converted to a voltage can be displayed as well. In most instances, oscilloscopes show events that repeat with either no change or that change slowly. Having an oscilloscope is useful for a test system. The more equipment one has in the test configuration, the greater need there is to automate the various testing processes. For an elaborate setup, then, one should use a platform such as LabVIEW and write specific application routines to enable the different test equipment to interface together. Keep in mind that the capabilities of the available equipment used in a given test system will likely limit the types of testing that can be performed. 2.3.1 System Setup This document describes two types of test system configurations: without LabVIEW and with LabVIEW. This section briefly describes each configuration. 2.3.1.1 Manual Test Systems (Without LabVIEW) Systems not using LabVIEW use the following test equipment and resources: 1. CCxxxx Evaluation Module 2. SmartRF Evaluation Board (one) 3. Male to Male SMA RF cable 4. Variable attenuators (two) 5. PC with SmartRF Studio software installed 6. RF coupler (combiner) 7. RF signal generator (two) 8. Signal analyzer 2.3.1.2 Automatic Test Systems (Using LabVIEW) Systems using LabVIEW use the following test equipment and resources: 1. CCxxxx Evaluation Module 2. SmartRF Evaluation Board (one) 3. Male to Male SMA RF cable 4. Signal analyzer 5. PC with SmartRF Studio and LabVIEW software installed 6. RF coupler (combiner) 7. RF signal generator (two) 6 Basic RF Testing of CCxxxx Devices SWRA370 – August 2011 Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated |
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