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DAC5682 Datasheet(PDF) 30 Page - Texas Instruments |
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DAC5682 Datasheet(HTML) 30 Page - Texas Instruments |
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30 / 49 page ![]() GC5330 GC5337 SLWS226 B – DECEMBER 2010 – REVISED JANUARY 2011 www.ti.com Programmable trigger actions for alarm1: (0) No action (1) Reduce gain of DPD output by programmable scale factor (programmed with stream[n].gain_reduce), only if alarm caused by y(k) > high_threshold and alm_polarit = 0 or 2. The gain reduction is applied at the CFR input. A control signal from the capture buffer block is used to select the programmed gain value for the multiplier at the CFR input. When the host resets this alarm by writing to the appropriate register, the control signal returns to 0 (state that is not selecting the programmed gain value). GENERAL SPECIFICATIONS General Electrical Characteristics This section describes the electrical characteristics for the CMOS interfaces (DVGA, MPU, JTAG, SPI, TESTMOD, RESETB and INTERRPT) and LVDS interfaces (BBIN, BBOUT, TXA, TXB, RXA, RXB, RXC, SYNC, DPDCLK) over recommended operating conditions (unless otherwise noted). Table 9. General Electrical Characteristics, CMOS Interface PARAMETER TEST CONDITIONS MIN NOM MAX UNIT VIL Voltage input low See (1) 0.8 V VIH Voltage input high See (1) 2 VDDSHV V VOL Voltage output low IOL = 2 mA (1) 0.5 V VOH Voltage output high IOH = –2 mA) (1) 2.4 VDDSHV V |IPU| Pullup current VIN = 0 V (1) 30 100 250 µA |IPD| Pulldown current VIN = VDDSHV (1) 30 100 250 µA |IIN| Leakage current VIN = 0 or VDDSHV (1) (2) 20 µA (1) Chip specifications are production tested at 90 °C case temperature for the given specification. Early production lots are sample tested at –40°C. (2) For inputs with no pullup or pulldown, inputs with pullup and VIN = VDDSHV, inputs with pulldown and VIN = 0, and bidirectionals in input mode in either state. Table 10. General Electrical Characteristics, LVDS Interfaces PARAMETER TEST CONDITIONS MIN NOM MAX UNIT VICM Input common mode voltage (VP – VN)/2 See (1) 700 1500 mV |VP – VN| Input differential voltage See (1) 150 700 mV RIN Input differential impedance See (1) 80 92 120 Ω VCOM Output common-mode voltage See (2) 1125 1200 1275 mV VOD Ouput differential voltage See (1) 250 500 mV (1) Chip specifications are production tested at 90 °C case temperature for the given specification. Early production lots are sample tested at –40°C. (2) Characteristics are determined by design. General Switching Characteristics The baseband interface TX has a single DDR interface input mode. The customer logic and trace routing must meet the listed tsu and th input timing. 30 Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): GC5330 GC5337 |
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