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LTC2602 Datasheet(PDF) 23 Page - Linear Technology

Part # LTC2602
Description  Octal, 12-Bit Sign, 1.5Msps/Ch Simultaneous Sampling ADC
PDF  32 Pages
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Manufacturer  LINER [Linear Technology]
Direct Link  http://www.linear.com
Logo LINER - Linear Technology

LTC2602 Datasheet(HTML) 23 Page - Linear Technology

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LTC2320-12
23
Rev B
For more information www.analog.com
APPLICATIONS INFORMATION
signal swing and corresponding SNR, the LTC6655-5 is
recommended when overdriving REFOUT. The LTC6655-5
offers the same small size, accuracy, drift and extended
temperature range as the LTC6655-4.096. By using a 5V
reference, a higher SNR can be achieved. We recommend
bypassing the LTC6655-5 with a 10μF ceramic capacitor
(X5R, 0805 size) close to each of the REFOUT1,2,3,4
pins. If the REF pin voltage is used as a REFOUT refer-
ence when REFBUFEN is connected to GND, it should be
buffered externally.
Internal Reference Buffer Transient Response
The REFOUT1,2,3,4 pins of the LTC2320-12 draw charge
(QCONV) from the external bypass capacitors during each
conversion cycle. If the internal reference buffer is over-
driven,theexternalreferencemustprovideallofthischarge
with a DC current equivalent to IREF = QCONV/tCYC.
Thus, the DC current draw of IREFOUT1,2,3,4 depends
on the sampling rate and output code. In applications
where a burst of samples is taken after idling for long
periods, as shown in Figure 14 , IREFBUF quickly goes from
approximately ~75µA to a maximum of 500µA for REFOUT
= 5V at 1.5Msps. This step in DC current draw triggers a
transient response in the external reference that must be
considered since any deviation in the voltage at REFOUT
will affect the accuracy of the output code. If an external
reference is used to overdrive REFOUT1,2,3,4, the fast
settling LTC6655 reference is recommended.
CNV
232012 F14
IDLE
PERIOD
Figure 14. CNV Waveform Showing Burst Sampling
Figure 15. Transient Response of the LTC2320-12
4.096V RANGE
IN+ = 1.5MHz SQUARE WAVE
IN– = 0V
SETTLING TIME (ns)
–20 –10 0 10 20 30 40 50 60 70 80 90
–1024
0
1024
2048
3072
4096
232012 F15
DYNAMIC PERFORMANCE
Fast Fourier transform (FFT) techniques are used to test
the ADC’s frequency response, distortion and noise at the
rated throughput. By applying a low distortion sine wave
and analyzing the digital output using an FFT algorithm,
the ADC’s spectral content can be examined for frequen-
cies outside the fundamental. The LTC2320-12 provides
guaranteed tested limits for both AC distortion and noise
measurements.
Signal-to-Noise and Distortion Ratio (SINAD)
The signal-to-noise and distortion ratio (SINAD) is the
ratio between the RMS amplitude of the fundamental input
frequency and the RMS amplitude of all other frequency
components at the A/D output. The output is bandlimited
to frequencies from above DC and below half the sampling
frequency.Figure 16 showsthattheLTC2320-12achieves
a typical SINAD of 77dB at a 1.5MHz sampling rate with
a 500kHz input.
Signal-to-Noise Ratio (SNR)
The signal-to-noise ratio (SNR) is the ratio between the
RMS amplitude of the fundamental input frequency and
the RMS amplitude of all other frequency components
except the first five harmonics and DC. Figure 16 shows
that the LTC2320-12 achieves a typical SNR of 77dB at a
1.5MHz sampling rate with a 500kHz input.



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