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DLP470TP

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DLPS105A – JANUARY 2018 – REVISED MAY 2018

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Copyright © 2018, Texas Instruments Incorporated

Recommended Operating Conditions (continued)

Over operating free-air temperature range (unless otherwise noted). The functional performance of the device specified in this

data sheet is achieved when operating the device within the limits defined by this table. No level of performance is implied

when operating the device above or below these limits.

MIN

NOM

MAX

UNIT

(9)

See LVDS timing requirements in Timing Requirements and Figure 6.

(10) See Figure 5 LVDS waveform requirements.

(11) Simultaneous exposure of the DMD to the maximum Recommended Operating Conditions for temperature and UV illumination reduces

device lifetime.

(12) The array temperature cannot be measured directly and must be computed analytically from the temperature measured at test point 1

(TP1) shown in Figure 10 and the package thermal resistance using the Micromirror Array Temperature Calculation.

(13) Per Figure 1, the maximum operational array temperature should be derated based on the micromirror landed duty cycle that the DMD

experiences in the end application. See Micromirror Landed-On/Landed-Off Duty Cycle for a definition of micromirror landed duty cycle.

(14) Long-term is defined as the useful life of the device.

(15) Short-term is the total cumulative time over the useful life of the device.

(16) The locations of thermal test points TP2, TP3, TP4, and TP5 shown in Figure 10 are intended to measure the highest window edge

temperature. For most applications, the locations shown are representative of the highest window edge temperature. If a particular

application causes additional points on the window edge to be at a higher temperature, test points should be added to those locations.

(17) The maximum marginal ray angle of the incoming illumination light at any point in the micromirror array, including pond of micromirrors

(POM), should not exceed 55 degrees from the normal to the device array plane. The device window aperture has not necessarily been

designed to allow incoming light at higher maximum angles to pass to the micromirrors, and the device performance has not been tested

nor qualified at angles exceeding this. Illumination light exceeding this angle outside the micromirror array (including POM) will

contribute to thermal limitations described in this document, and may negatively affect lifetime.

(18) Temperature delta is the highest difference between the ceramic test point 1 (TP1) and anywhere on the window edge as shown in

Figure 10. The window test points TP2, TP3, TP4, and TP5 shown in Figure 10 are intended to result in the worst case delta

temperature. If a particular application causes another point on the window edge to result in a larger delta in temperature, that point

should be used.

(19) The average over time (including storage and operating) that the device is not in the ‘elevated dew point temperature range'.

(20) Exposure to dew point temperatures in the elevated range during storage and operation should be limited to less than a total

LVDS INTERFACE

400

MHz

150

300

440

mV

1100

1200

1300

mV

880

1520

mV

Time required for LVDS receivers to recover from PWRDNZ

2000

ns

Internal differential termination resistance

80

100

120

Ω

Line differential impedance (PWB/trace)

90

100

110

Ω

ENVIRONMENTAL

0

°C

–20

–10

°C

–10

0

°C

70

75

°C

85

°C

Absolute temperature delta between any point on the window edge and

14

°C

24

°C

28

36

°C

Cumulative time in elevated dew point temperature range

6

months

0.68

2.00

Illumination wavelengths between 400 nm and 700 nm

Thermally limited

Illumination wavelengths > 700 nm

10

55

degrees