HCPL-0721 datasheet(8/21 Pages) BOARDCOM

8 / 21 page

Broadcom

AV02-0876EN

HCPL-0720, HCPL-7720, HCPL-0721,

and HCPL-7721 Data Sheet

40-ns Propagation Delay, CMOS Optocoupler

Package Characteristics

Common Mode

|CMH|

—

kV/

μsVI= VDD1, VO> 0.8 VDD1,

VCM = 1000V VI = 0V,

VO > 0.8V, VCM = 1000V

Transient Immunity at Logic High

Output

——

—

Common Mode Transient Immunity

at Logic Low Output

|CML|10

—

Input Dynamic Power Dissipation

Capacitance

CPD1

—60

—

Output Dynamic Power Dissipation

Capacitance

CPD2

—10

—

a. tPHL propagation delay is measured from the 50% level on the falling edge of the VI signal to the 50% level of the falling edge of the VO signal.

tPLH propagation delay is measured from the 50% level on the rising edge of the VI signal to the 50% level of the rising edge of the VO signal.

b. PWD is defined as |tPHL – tPLH|. %PWD (percent pulse width distortion) is equal to the PWD divided by pulse width.

c. tPSK is equal to the magnitude of the worst-case difference in tPHL and/or tPLH that will be seen between units at any given temperature within

the recommended operating conditions.

d. CMH is the maximum common mode voltage slew rate that can be sustained while maintaining VO > 0.8VDD2. CML is the maximum common

mode voltage slew rate that can be sustained while maintaining VO < 0.8V. The common mode voltage slew rates apply to both rising and

falling common mode voltage edges.

e. Unloaded dynamic power dissipation is calculated as follows: CPD × VDD2 × f + IDD × VDD, where f is switching frequency in MHz.

Parameter

Symbol

Min.

Typ.

Max.

Unit

Test Conditions

Fig.

Note

Input-Output Momentary

Withstand Voltage

–072X

VISO

3750

—

Vrms

RH ≤ 50%,

t = 1 min,

TA = 25°C

a, b, c

a. Device considered a two-terminal device: pins 1, 2, 3, and 4 shorted together and pins 5, 6, 7, and 8 shorted together.

b. In accordance with UL1577, each HCPL-072X is proof tested by applying an insulation test voltage ≥ 4500 Vrms for 1 second (leakage

detection current limit, II-O ≤ 5 μA). Each HCPL-772X is proof tested by applying an insulation test voltage ≥ 4500 Vrms for 1 second (leakage

detection current limit. II-O ≤ 5 μA).

c. The Input-Output Momentary Withstand Voltage is a dielectric voltage rating that should not be interpreted as an input-output continuous

voltage rating.

–772X

3750

—

Option 020

5000

—

Input-Output Resistance

RI-O

—

1012

—Ω

VI-O = 500 Vdc

Input-Output Capacitance

CI-O

—

0.6

—

f = 1 MHz

Input Capacitance

—3.0

—

d. CI is the capacitance measured at pin 2 (VI).

Input IC Junction-to-Case

Thermal Resistance

–772X

θjci

—

145

—

°C/W

Thermocouple

located at center

underside of

package

–072X

—

160

—

Output IC Junction-to-Case

Thermal Resistance

–772X

θjco

—

140

—

°C/W

–072X

—

135

—

Package Power Dissipation

PPD

—

150

Parameter

Symbol

Min.

Typ.

Max.

Unit

Test Conditions

Fig.

Note

HCPL-0721 Datasheet(PDF) 8 Page - Broadcom Corporation.

HCPL-0721 Datasheet(HTML) 8 Page - Broadcom Corporation.

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