CD1020 datasheet(55/56 Pages) NXP

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NXP Semiconductors

CD1020

Reference section

Revision history

Table 45. CD1020 reference documents

Reference

Description

CDF-AEC-Q100

Stress Test Qualification For Automotive Grade Integrated Circuits

Q-1000

Qualification Specification for Integrated Circuits

SQ-1001

Specification Conformance

ISO 7637

Electrical Disturbances from Conduction and Coupling

ISO 61000

Electromagnetic Compatibility

Revision

Date

Description of changes

1.0

6/2017

• Initial release

2.0

2/2018

• Changed document specification state from Product Preview to Advance Information

• Table 3, Maximum ratings

• Deleted VESD6-1, description, parameter, and footnote 5

• Table 6, Static electrical characteristics

• Added footnote ‘AMUX output voltage deviates when there are negative inputs on other SGx/SPx pins.’ to

VGNDOFFSET and VOFFSET

• Table 7, Dynamic electrical characteristics

• Deleted iINT-TIMER row

• Section 7.8, deleted last sentence of section, ‘Since the device is required...’

• Table 11, Device configuration register

• Changed bit 9 from Aconfig1 to Unused

• Changed bit 8 from Aconfig0 to Unused

• Section 7.10.22, AMUX control register

• Changed ‘Internal to the CD1020 is a 24-to-1...’ to ‘Internal to the CD1020 is a 22-to-1...’

• Section 8.2, Bill of materials

• Changed item 9 from ‘...SWITCH INTERFACE SOIC32’ to ‘...SWITCH INTERFACE QFN 32 pin’

3.0

7/2018

• Changed document status from Advance Information to Technical Data

• Added tCSB_WAKEUP parameter to Table 7

4.0

7/2019

• Updated Figure 22 and Table 43, Bill of materials as per CIN 201907004I

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