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MPC8540 Datasheet(PDF) 1113 Page - Freescale Semiconductor, Inc |
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MPC8540 Datasheet(HTML) 1113 Page - Freescale Semiconductor, Inc |
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1113 / 1302 page ![]() External Signal Descriptions MPC8540 PowerQUICC III Integrated Host Processor Reference Manual, Rev. 1 Freescale Semiconductor 20-7 20.2.2 Detailed Signal Descriptions This section describes the details of the debug, watchpoint monitor, and JTAG test signals 20.2.2.1 Debug Signals—Details Table 20-3 describes all signals associated with device debug modes. TMS Test mode select Debug Carries commands to the TAP controller for boundary scan operations. Internally pulled up 1I 20-9 TRST Test reset Debug Resets the TAP controller asynchronously — I 20-9 THERM[0:1] Thermal resistor access Test These pins tie directly to an internal resistor whose value varies linearly with temperature. —I 20-9 TEST_SEL Test select Test Factory test. Must be negated for normal operation — I 20-9 LSSD_ MODE Test Test Factory Test. Refer to the MPC8540 Integrated Processor Hardware Specifications for proper treatment. I 20-9 L1_TSTCLK Test Test Factory Test. Refer to the MPC8540 Integrated Processor Hardware Specifications for proper treatment. I 20-9 L2_TSTCLK Test Test Factory Test. Refer to the MPC8540 Integrated Processor Hardware Specifications for proper treatment. I 20-9 1 Although these signals are normally bidirectional, when sourcing debug information they are output only. Table 20-3. Debug Signals—Detailed Signal Descriptions Signal I/O Description MDVAL O Memory data-valid. Indicates when valid data is available. May be used by a logic analyzer to capture the data on the data bus. State Meaning Asserted—Indicates that data is valid on the data bus during the current clock cycle. When the DDR SDRAM interface is selected to source information on MDVAL, this signal is valid for every cycle that data is driven or received on the DDR SDRAM interface. When the LBC is selected, this signal is valid for every cycle that data is driven or received on the local bus interface. The assertion of this signal may be used by a logic analyzer to capture data. Timing Asserted/Negated—Referenced to the selected interface, (DDR or local bus). Asserts when data is valid. Assertions are held for the duration of the transfer. Read data timing is similar to MA. Write data timing is similar to the output MDQ. Table 20-2. Debug, Watchpoint and Test Signal Summary (continued) Name Description Functional Block Function Reset Value I/O Page # |
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