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MPC8610EC Datasheet(PDF) 89 Page - NXP Semiconductors |
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MPC8610EC Datasheet(HTML) 89 Page - NXP Semiconductors |
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89 / 96 page ![]() Hardware Design Considerations MPC8610 Integrated Host Processor Hardware Specifications, Rev. 2 Freescale Semiconductor 89 modeled as a collapsed thermal resistance with thermal conductivity of 12.1 W/(m • K) and an effective height of 0.1 mm. The thermal model uses median dimensions to reduce grid. Please refer to the case outline for actual dimensions. The thermal model uses approximate dimensions to reduce grid. The approximations used do not impact thermal performance. Please refer to the case outline for exact dimensions. Figure 57. MPC8610 Thermal Model 3.12.2.5 Temperature Diode The MPC8610 has a temperature diode on the microprocessor that can be used in conjunction with other system temperature monitoring devices (such as Analog Devices, ADT7461™). These devices use the negative temperature coefficient of a diode operated at a constant current to determine the temperature of the microprocessor and its environment. For proper operation, the monitoring device used should auto-calibrate the device by canceling out the VBE variation of each MPC8610’s internal diode. The following are the specifications of the MPC8610 on-board temperature diode: Vf > 0.40 V Vf < 0.90 V Operating range 2–300 μA Diode leakage < 10 nA @ 125 °C Bump and Underfill Die Substrate Solder/Air Die Substrate Side View of Model (Not to Scale) Top View of Model (Not to Scale) x y z Conductivity Value Unit Die (8.5 x 9.7 x 0.86mm) Silicon Temperature dependent Bump and Underfill (8.5 × 9.7 × 0.07 mm) Collapsed Resistance kz 8.1 W/(m • K) Substrate (29 × 29 × 1.18 mm) kx 23.3 W/(m • K) ky 23.3 kz 0.95 Solder and Air (29 × 29 × 0.4 mm) kx 0.034 W/(m • K) ky 0.034 kz 12.1 |
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