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SE050 Datasheet(PDF) 16 Page - NXP Semiconductors |
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SE050 Datasheet(HTML) 16 Page - NXP Semiconductors |
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16 / 32 page ![]() NXP Semiconductors SE050 Plug & Trust Secure Element In Table 10 VCC means for IO1 voltage on VCC pin, for IO2 voltage on VIN pin Maximum supported supply voltage is 6 V. In case of supply voltages above 3.6 V, Deep Power-down mode current <5 µA is not guaranteed. Symbol Parameter Conditions Min Typ Max Unit IIL LOW level input current 0 V ≤ VI ≤ 0.3 VCC; Test conditions for the maximum absolute value: IIL(max):VI = 0 V, VCC = VCC(max) -50 μA ITL HIGH-to-LOW transition input current (only "quasi-bidirect ional" mode) 0.3 VCC < VI ≤ VCC; Test conditions for the maximum absolute value: VI = 0.5 VCC, VCC = VCC(max) [1] -250 μA II Input current in "weak pull-up" input mode 0 V ≤ VI ≤ VCC; Test conditions for the maximum absolute value: II(max):VI = 0 V, VCC = VCC(max) 0 -50 μA IILIH Leakage input current at input voltage beyond VCC in "weak pull-up" input mode VCC < VI ≤ VCC + 0.3 V; -40 °C ≤ Tamb ≤ +105 °C; Test conditions: VI = VCC + 0.3 V; VCC = VCC(max)Tamb = +105 °C 20 μA -0.3 V ≤ VI < 0 V; -40 °C ≤ Tamb ≤ +30 °C Test conditions: VI = -0.3 V; VCC= VCC(max)Tamb = +30 °C -50 μA IILIL Leakage input current at input voltage below VSS in "weak pull-up" input mode -0.3 V ≤ VI < 0 V;+30 °C ≤ Tamb ≤ +105 °C Test conditions: VI = -0.3 V; VCC= VCC(max)Tamb = +105 °C -1000 μA IILIHQ Leakage input current at input voltage beyond VCC (only in "quasi-bidirectional" mode) VCC < VI ≤ VCC + 0.3 V; -40 °C ≤ Tamb≤ +105 °C Test conditions: VI = VCC + 0.3 V;VCC = VCC(max); Tamb = +105 °C 100 μA Table 10. Electrical DC characteristics of Input/Output: IO1/IO2. Conditions: VCC = 1.62 V to 3.6 V (see ; VSS = 0 V; Tamb = -40 °C to + 105 °C, unless otherwise specified...continued SE050 All information provided in this document is subject to legal disclaimers. © 2022 NXP B.V. All rights reserved. Product data sheet Rev. 3.5 — 22 August 2022 504935 16 / 32 |
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