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LXT6155LE Datasheet(PDF) 41 Page - Intel Corporation |
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LXT6155LE Datasheet(HTML) 41 Page - Intel Corporation |
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41 / 50 page  Datasheet 41 155 Mbps SDH/SONET/ATM Transceiver — LXT6155 LOS Thresholds - Coax Assert 18 dB Attenuation measured at 78 MHz, CMI, 75 Ω load. 12.7 dB cable loss plus remaining flat loss. De-assert 17 dB LOS hysteresis - coax HYS 1.0 4.0 dB Measured from the level where LOS is asserted. PRBS(23) data. Receive jitter generation2 (intrinsic jitter SONET spec) 12 kHz - 1.3 MHz 0.01 UIrms CMI encoded PRBS(23) at RTIP/RRING with no data jitter. Transmit input = all zeros Refer to Figure 27 and Table 33. 0.1 UIpp Receive jitter generation2 (intrinsic jitter SDH spec) 500 Hz - 1.3 MHz 1.5 UIpp 65 kHz - 1.3 MHz 0.075 UIpp Receive jitter transfer peaking 2 DC - 230 kHz 0.4 dB PRBS(23) Data. Input jitter as the max. tolerance curve shown inFigure26. Receive jitter tolerance2 0.1 Hz - 19.3 Hz 39 UIpp BER=1E-10. Tolerated jitter meets Figure 26 500Hz- 6.5kHz 1.5 UIpp 65 kHz - 0.15 UIpp PLL nominal center frequency Fnom 155.52 MHz PLL capture range Fcap -20 +20 ppm PLL track range Ftrack -20 +20 ppm PLL lock time Tlock 100 µs PRBS(23) pattern, from data applied at RTIP/RRING. Device in fiber optic mode. Equalizer adaptation time 500 bits From data applied Line input impedance (RTIP and RRING) RIN 4 k Ω Differential resistance Parameter Sym Min Typ Max Unit Test Conditions1 Rise/Fall time - All TTL outputs tRF 25 ns Load 1.6mA, 50pF SDI to SCLK setup time tDC 5 ns SCLK to SDI hold time tCDH 5 ns SCLK low time tCL 120 ns SCLK high time tCH 120 ns SCLK rise and fall time tR, tF 25 ns CS to SCLK setup time tCC 5 ns SCLK to CS hold time tCCH 5 ns CS inactive time tCWH 5 ns SCLK to SDO valid tCDV 0 20 ns 1. Typical values are at 25C and 3.3V. They are for design aid only; not guaranteed and not subject to production testing. Table 31. Receive Analog Characteristics (Continued) Parameter Note Min Typ1 Max Unit Test Conditions 1. Typical values are at 25C and 3.3V. They are for design aid only; not guaranteed and not subject to production testing. 2. Not production tested, guaranteed by design and other correlation factors. |
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