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33970 Datasheet(PDF) 4 Page - Freescale Semiconductor, Inc |
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33970 Datasheet(HTML) 4 Page - Freescale Semiconductor, Inc |
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4 / 36 page ![]() Analog Integrated Circuit Device Data 4 Freescale Semiconductor 33970 ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS Table 2. Maximum Ratings All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or permanent damage to the device. Ratings Symbol Value Unit ELECTRICAL RATINGS Power Supply Voltage Steady State VPWR(SUS) -0.3 to 41 V Input Pin Voltage (1) VIN -0.3 to 7.0 V SIN+/- COS+/- Continuous Per Output Current (2) IOUTMAX 40 mA ESD Voltage (3) Human Body Model Machine Model VESD1 VESD2 ±2000 ±200 V THERMAL RATINGS Storage Temperature TSTG -55 to 150 °C Operating Junction Temperature TJ -40 to 150 °C Thermal Resistance Junction to Ambient Junction to Lead RθJA RθJL 60 20 °C/W THERMAL RESISTANCE Peak Package Reflow Temperature During Reflow (4), (5) TPPRT Note 5 °C Notes 1. Exceeding voltage limits on Input pins may cause permanent damage to the device. 2. Output continuous output rating so long as maximum junction temperature is not exceeded. Operation at 125°C ambient temperature will require maximum output current computation using package thermal resistances. 3. ESD1 testing is performed in accordance with the Human Body Model (CZAP = 100 pF, RZAP = 1500 Ω), ESD2 testing is performed in accordance with the Machine Model (CZAP = 200 pF, RZAP = 0 Ω). 4. Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may cause malfunction or permanent damage to the device. 5. Freescale’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow Temperature and Moisture Sensitivity Levels (MSL), Go to www.freescale.com, search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all orderable parts. (i.e. MC33xxxD enter 33xxx), and review parametrics. |
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