S29GL01GS datasheet(74/118 Pages) INFINEON

74 / 118 page

Datasheet

001-98285 Rev. *T

2023-07-17

128 Mb/256 Mb/512 Mb/1 Gb GL-S MIRRORBIT™ Flash

Parallel, 3.0 V

Electrical specifications

10.1

Absolute maximum ratings

10.2

Latchup characteristics

This product complies with JEDEC standard JESD78C latchup testing requirements.

10.3

Thermal resistance

Table 50

Absolute maximum ratings

Storage temperature plastic packages

–65°C to +150°C

Ambient temperature with power applied

–65°C to +125°C

Voltage with respect to ground

All pins other than RESET# [73]

–0.5 V to (VIO + 0.5 V)

RESET#[73]

–0.5 V to (VCC + 0.5 V)

Output short circuit current[74]

100 mA

VCC

–0.5 V to +4.0 V

VIO

–0.5 V to +4.0 V

Table 51

Thermal resistance

Parameter

Description

Part number

LAA064

LAE064

TS056

VBU056 Unit

Theta JA

Thermal resistance

(junction to ambient)

S29GL01GS

19.8

27.3

–

°C/W

S29GL512S

22.2

30.4

30.2

S29GL256S

24.1

34.47

S29GL128S

25.2

34.1

56.7

35.94

Theta JB

Thermal resistance

(junction to board)

S29GL01GS

6.5

5.7

–

S29GL512S

10.5

8.4

8.14

S29GL256S

11.7

12.2

54.7

12.1

S29GL128S

13.70

13.64

Theta JC

Thermal resistance

(junction to case)

S29GL01GS

5.19

6.0

11.2

–

S29GL512S

6.8

7.5

S29GL256S

7.4

10.1

10.11

S29GL128S

10.3

9.74

11.36

Notes

73.Minimum DC voltage on input or I/O pins is –0.5 V. During voltage transitions, input or I/O pins may

undershoot VSS to –2.0 V for periods of up to 20 ns. See Figure 11. Maximum DC voltage on input or I/O pins

is VCC + 0.5 V. During voltage transitions, input or I/O pins may overshoot to VCC + 2.0 V for periods up to

20 ns. See Figure 12.

74.No more than one output may be shorted to ground at a time. Duration of the short circuit should not be

greater than one second.

75.Stresses above those listed under Absolute maximum ratings may cause permanent damage to the device.

This is a stress rating only; functional operation of the device at these or any other conditions above those

indicated in the operational sections of this data sheet is not implied. Exposure of the device to absolute

maximum rating conditions for extended periods may affect device reliability.

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