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SE97BTP Datasheet(PDF) 38 Page - NXP Semiconductors |
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SE97BTP Datasheet(HTML) 38 Page - NXP Semiconductors |
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38 / 53 page ![]() SE97B_1 © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 01 — 27 January 2010 38 of 53 NXP Semiconductors SE97B DDR memory module temp sensor with integrated SPD 10. Limiting values 11. Characteristics Table 29. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter Conditions Min Max Unit VDD supply voltage −0.5 +4.3 V Vn voltage on any other pin SDA, SCL, A1, A2, EVENT pins −0.5 +4.3 V VA0 voltage on pin A0 overvoltage input; A0 pin −0.5 +12.5 V Isink sink current SDA, EVENT pins −1+10 mA Tj(max) maximum junction temperature - 150 °C Tstg storage temperature −65 +165 °C Table 30. Thermal sensor characteristics VDD = 3.0 V to 3.6 V; Tamb = −40 °C to +125 °C; unless otherwise specified. Symbol Parameter Conditions Min Typ Max Unit Tlim(acc) temperature limit accuracy B-grade; VDD = 3.0 V to 3.6 V Tamb =75 °Cto95 °C −1.0 < ±0.5 +1.0 °C Tamb =40 °Cto125 °C −2.0 < ±1.0 +2.0 °C Tamb = −40 °Cto+125 °C −3.0 < ±2+3.0 °C Tres temperature resolution - 0.125 - °C Tconv conversion period - 100 120 ms Ef(conv) conversion rate error percentage error in programmed data −30 - 30 % |
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