DAC5682Z datasheet(19/59 Pages) TI

19 / 59 page

TYPICAL APPLICATION SCHEMATIC

DAC5682Z

www.ti.com ........................................................................................................................................................ SLLS853C – AUGUST 2007 – REVISED JUNE 2009

Offset Drift: Defined as the maximum change in DC offset, in terms of ppm of full-scale range (FSR) per °C,

from the value at ambient (25°C) to values over the full operating temperature range.

Offset Error: Defined as the percentage error (in FSR%) for the ratio of the differential output current

(IOUT1–IOUT2) and the mid-scale output current.

Output Compliance Range: Defined as the minimum and maximum allowable voltage at the output of the

current-output DAC. Exceeding this limit may result reduced reliability of the device or adversely affecting

distortion performance.

Reference Voltage Drift: Defined as the maximum change of the reference voltage in ppm per degree Celsius

from value at ambient (25°C) to values over the full operating temperature range.

Spurious Free Dynamic Range (SFDR): Defined as the difference (in dBc) between the peak amplitude of the

output signal and the peak spurious signal.

Signal to Noise Ratio (SNR): Defined as the ratio of the RMS value of the fundamental output signal to the

RMS sum of all other spectral components below the Nyquist frequency, including noise, but excluding the first

six harmonics and dc.

(1)

Power supply decoupling capacitors not shown.

(2)

Internal Reference configuration shown.

Figure 26. Schematic

Submit Documentation Feedback

Product Folder Link(s): DAC5682Z

DAC5682Z Datasheet(PDF) 19 Page - Texas Instruments

DAC5682Z Datasheet(HTML) 19 Page - Texas Instruments

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59

Datasheet Download

Link URL