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DAC5682Z Datasheet(PDF) 23 Page - Texas Instruments |
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DAC5682Z Datasheet(HTML) 23 Page - Texas Instruments |
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23 / 59 page ![]() DAC5682Z www.ti.com ........................................................................................................................................................ SLLS853C – AUGUST 2007 – REVISED JUNE 2009 Register name: CONFIG3 – Address: 0x03, Default = 0x70 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 DAC_offset SLFTST_err FIFO_err_ Pattern_err_ SwapAB_out B_equals_A SW_sync SW_sync_sel _mask mask mask _ena 0 1 1 1 0 0 0 0 DAC_offset_ena: When set, the values of OffsetA(12:0) and OffsetB(12:0) in CONFIG12 through CONFIG15 registers are summed into the DAC-A and DAC-B data paths. This provides a system-level offset adjustment capability that is independent of the input data. SLFTST_err_mask: When set, masks out the SLFTST_err bit in STATUS4 register. Refer to Digital Self Test Mode section for details on SLFTST operation. FIFO_err_mask: When set, masks out the FIFO_err bit in STATUS4 register. Pattern_err_mask: When set, masks out the Pattern err bit in STATUS4 register. SwapAB_out: When set, the A/B data paths are swapped prior to routing to the DAC-A and DAC-B outputs. B_equals_A: When set, the data routed to DAC-A is also routed to DAC-B. This allows wire OR’ing of the two DAC outputs together at the board level to create a 2X drive strength single DAC output. SW_sync: This bit can be used as a substitute for the LVDS external SYNC input pins for both synchronization and transmit enable control. SW_sync_sel: When set, the SW_sync bit is used as the only synchronization input and the LVDS external SYNC input pins are ignored. Register name: STATUS4 – Address: 0x04, Default = 0x00 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 Unused SLFTST_err FIFO_err Pattern_err Unused Unused Unused Unused 0 0 0 0 0 0 0 0 SLFTST_err: Asserted when the Digital Self Test (SLFTST) fails. To clear the error, write a ‘0’ to this register bit. This bit is also output on the SDO pin when the Self Test is enabled via SLFTST_ena control bit in CONFIG1. Refer to Digital Self Test Mode section for details on SLFTST operation. FIFO_err: Asserted when the FIFO pointers over run each other causing a sample to be missed. To clear the error, write a ‘0’ to this register bit. Pattern_err: A digital checkerboard pattern compare function is provided for board level confidence testing and DLL limit checks. If the Pattern_err_mask bit via CONFIG3 is cleared, logic is enabled to continuously monitor input FIFO data. Any received data pattern other than 0xAAAA or 0x5555 causes this bit to be set. To clear the error, flush out the previous pattern error by inputting at least 8 samples of the 0xAAAA and/or 0x5555, then write a ‘0’ to this register bit. Copyright © 2007–2009, Texas Instruments Incorporated Submit Documentation Feedback 23 Product Folder Link(s): DAC5682Z |
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