| Electronic Components Datasheet Search |
|
ML7033 Datasheet(PDF) 48 Page - LAPIS Semiconductor Co., Ltd. |
|
|
|||||||||||||||||||||||||||||
ML7033 Datasheet(HTML) 48 Page - LAPIS Semiconductor Co., Ltd. |
|
48 / 52 page ![]() FEDL7033-04 ML7033 48/52 CR18 (Test control) B7 B6 B5 B4 B3 B2 B1 B0 CR18 CH2 LOOP1 CH2 LOOP0 CH1 LOOP1 CH1 LOOP0 TEST3 TEST2 TEST1 TEST0 default 0 0 0 0 0 0 0 0 B7, B6 … CH2 loop-back test mode select (B7, B6): (0, 0) = Loop-back OFF (0, 1) = Loop-back OFF (1, 0) = Channel 2 digital loop-back test. PCM data output on the PCMOUT pin during normal operation is internally looped back through the Receive path via the PCMIN pin. In digital loop-back test mode, input data on PCMIN pin is ignored, but PCM data continues to be output on the PCMOUT pin. (1, 1) = Channel 2 analog loop-back test. Analog signals output on the AOUT2P pin (or the AOUT2P and AOUT2N pins) are internally looped back to the transmit path behind a built-in feedback amplifier located after the AIN2P, AIN2N and GSX2 pins. In this mode, the AIN2P and AIN2N input pins are ignored. However, analog signals continue to be output on the AOUT2P pin (or the AOUT2P and the AOUT2N pins). A loop-back test is functional only if XSYNC and RSYNC are from the same clock source. B5, B4 … CH1 loop-back test mode select (B5, B4): (0, 0) = Loop-back OFF (0, 1) = Loop-back OFF (1, 0) = Channel 1 digital loop-back test. PCM data is output on the PCMOUT pin in normal operation is internally looped back through the Receive path via the PCMIN pin. In loop-back test mode, input data on PCMIN pin is ignored. However, PCM data can be output on the PCMOUT pin. (1, 1) = Channel 1 analog loop-back test. Analog signals output on the AOUT1P pin (or from the AOUT1P and the AOUT1N pins) are internally looped back to the transmit path via a built-in feedback amplifier located after the AIN1P, AIN1N and GSX1 pins. In this mode, the AIN1P and AIN1N input pins are ignored. However, analog signals can be output from the AOUT1P pin (or from the AOUT1P and the AOUT1N pins). A loop-back test is functional if XSYNC and RSYNC are from the same clock source. B3 to B0 … LSI test registers for an LSI manufacturer The default alternation is prohibited. When a write action is executed for CR18, set all of these bits to “0”. |
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |