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AD9249 Datasheet(PDF) 25 Page - Analog Devices |
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AD9249 Datasheet(HTML) 25 Page - Analog Devices |
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25 / 37 page ![]() AD9249 Data Sheet Rev. 0 | Page 24 of 36 The PN sequence short pattern produces a pseudorandom bit sequence that repeats itself every 29 − 1 or 511 bits. Refer to Section 5.1 of the ITU-T 0.150 (05/96) standard for a description of the PN sequence and how it is generated. The seed value is all 1s (see Table 12 for the initial values). The output is a parallel representation of the serial PN9 sequence in MSB-first format. The first output word is the first 14 bits of the PN9 sequence in MSB aligned form. Table 12. PN Sequence Sequence Initial Value Next Three Output Samples (MSB First) Twos Complement PN Sequence Short 0x1FE0 0x1DF1, 0x3CC8, 0x294E PN Sequence Long 0x1FFF 0x1FE0, 0x2001, 0x1C00 The PN sequence long pattern produces a pseudorandom bit sequence that repeats itself every 223 − 1 or 8,388,607 bits. Refer to Section 5.6 of the ITU-T 0.150 (05/96) standard for a description of the PN sequence and how it is generated. The seed value is all 1s (see Table 12 for the initial values) and the AD9249 inverts the bit stream with relation to the ITU standard. The output is a parallel representation of the serial PN23 sequence in MSB-first format. The first output word is the first 14 bits of the PN23 sequence in MSB aligned format. Consult the Memory Map section for information on how to change these additional digital output timing features through the SPI. SDIO/DFS Pin For applications that do not require SPI mode operation, the CSB1 and CSB2 pins are tied to AVDD, and the SDIO/DFS pin controls the output data format select as described in Table 13. Table 13. Output Data Format Select Pin Settings DFS Pin Voltage Output Mode AVDD Twos complement GND (Default) Offset binary SCLK/DTP Pin The SCLK/DTP pin can enable a single digital test pattern if it and the CSB1 and CSB2 pins are held high during device power- up. When SCLK/DTP is tied to AVDD, the ADC channel outputs shift out the following pattern: 10 0000 0000 0000. The FCO±1, FCO±2, DCO±1, and DCO±2 pins function normally while all channels shift out the repeatable test pattern. This pattern allows the user to perform timing alignment adjustments among the FCO±1, FCO±2, DCO±1, DCO±2, and output data. The SCLK/ DTP pin has an internal 30 kΩ resistor to GND. It can be left unconnected for normal operation. Table 14. Digital Test Pattern Pin Settings Selected DTP DTP Voltage Resulting D±xx Normal Operation No connect Normal operation DTP AVDD 10 0000 0000 0000 Additional and custom test patterns can also be observed when commanded from the SPI port. Consult the Memory Map section for information about the options that are available. CSB1 and CSB2 Pins The CSB1 and CSB2 pins are tied to AVDD for applications that do not require SPI mode operation. Tying CSB1 and CSB2 high causes all SCLK and SDIO SPI communication information to be ignored. CSB1 selects/deselects SPI circuitry affecting outputs D±A1 to D±H1 (Bank 1). CSB2 selects/deselects SPI circuitry affecting outputs D±A2 to D±H2 (Bank 2). It is recommended that CSB1 and CSB2 be controlled with the same signal; that is, tie them together. In this way, whether tying them to AVDD or selecting SPI functionality, both banks of ADCs are controlled identically and are always in the same state. RBIAS1 and RBIAS2 Pins To set the internal core bias current of the ADC, place a 10.0 kΩ, 1% tolerance resistor to ground at each of the RBIAS1 and RBIAS2 pins. |
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