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A29DL323 Datasheet(PDF) 33 Page - AMIC Technology |
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A29DL323 Datasheet(HTML) 33 Page - AMIC Technology |
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33 / 50 page ![]() A29DL32x Series PRELIMINARY (May, 2005, Version 0.0) 32 AMIC Technology, Corp. TEST CONDITIONS Table 14. Test Specifications Test Condition -70, -80 -90, -120 Unit Output Load 1 TTL gate Output Load Capacitance, CL(including jig capacitance) 30 100 pF Input Rise and Fall Times 5 5 ns Input Pulse Levels 0.0 - 3.0 0.0 - 3.0 V Input timing measurement reference levels 1.5 1.5 V Output timing measurement reference levels 1.5 1.5 V Figure 9. Test Setup Figure 10. Input Waveforms and Measurement Levels Measurement Level Input 1.5V 1.5V Output 3.0V 0.0V 6.2 K Ω Device Under Test CL Diodes = IN3064 or Equivalent 2.7 K Ω 3.3 V |
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