A29DL323 datasheet(46/50 Pages) AMICC

46 / 50 page

A29DL32x Series

PRELIMINARY

(May, 2005, Version 0.0)

AMIC Technology, Corp.

ERASE AND PROGRAMMING PERFORMANCE

Parameter

Typ. (Note 1)

Max. (Note 2)

Unit

Comments

Sector Erase Time

0.7

sec

Chip Erase Time

sec

Excludes 00h programming

prior to erasure (Note 4)

Byte Programming Time

150

µs

Word Programming Time

210

µs

Accelerated Word/Byte Programming Time

120

µs

Byte Mode

sec

Chip Programming Time

(Note 3)

Word Mode

sec

Excludes system-level

overhead (Note 5)

Notes:

1. Typical program and erase times assume the following conditions: 25

°C, 3.0V VCC, 10,000 cycles. Additionally, programming

typically assumes checkerboard pattern.

2. Under worst case conditions of 90

°C, VCC = 2.7V, 100,000 cycles.

3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes

program faster than the maximum byte program time listed.

4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.

5. System-level overhead is the time required to execute the four-bus-cycle command sequence for programming. See Table 12

for further information on command definitions.

6. The device has a minimum erase and program cycle endurance of 10,000 cycles.

LATCH-UP CHARACTERISTICS

Description

Min.

Max.

Input Voltage with respect to VSS on all I/O pins

-1.0V

VCC+1.0V

VCC Current

-100 mA

+100 mA

Input voltage with respect to VSS on all pins except I/O pins

(including A9,

OE and

RESET )

-1.0V

12.5V

Includes all pins except VCC. Test conditions: VCC = 3.0V, one pin at time.

PACKAGE AND PIN CAPACITANCE

Parameter Symbol

Parameter Description

Test Setup

Typ.

Max.

Unit

TSOP

7.5

CIN

Input Capacitance

VIN=0

TF BGA

4.2

TSOP

8.5

COUT

Output Capacitance

VOUT=0

TF BGA

5.4

6.5

TSOP

7.5

CIN2

Control Pin Capacitance

VIN=0

TF BGA

3.9

4.7

Notes:

1. Sampled, not 100% tested.

2. Test conditions TA = 25

°C, f = 1.0MHz

DATA RETENTION

Parameter

Test Conditions

Min

Unit

150

°C

Years

Minimum Pattern Data Retention Time

125

°C

Years

A29DL323 Datasheet(PDF) 46 Page - AMIC Technology

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