M263 datasheet(344/398 Pages) NUVOTON

344 / 398 page

M261/M262/M263

Mar 25, 2020

Page 344 of 398

Rev 1.02

Symbol

Ratings

Conditions

Max

Unit

VEFTB

[*3] [*4]

Fast transient voltage burst limits to be applied through

100 pF on VDD and VSS pins to induce a functional

disturbance

VDD = 3.3 V, LQFP128, TA =

+25 °C, fHCLK = 64 MHz,

4.4

VESD(HBM)

[*5] Electrostatic discharge voltage (human body model)

TA = +25 °C

VESD(CDM)

[*6] Electrostatic discharge voltage (charge device model)

TA = +25 °C

0.5

[*7]

Static latch-up class

A  +25 °C

400

Note:

Guaranteed by characterization results, not tested in production.

On VBAT pin, VESD(HBM) is limited to 1000V.

Determinded according to IEC 61000-4-4 Electrical fast transient/burst immunity test.

The performace cretia class is 4A.

Determined according to JEDEC EIA/JESD78 standard.

Determined according to ANSI/ESDA/JEDEC JS-001 Standard, Electrostatic Discharge Sensitivity Testing

– Human

Body Model (HBM)

– Component Level

Determined according to ANSI/ESDA/JEDEC JS-002 standard for Electrostatic Discharge Sensitivity (ESD) Testing

–

Charged Device Model (CDM)

– Component Level.

Table 8.1-4 EMC Characteristics

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