M263 datasheet(343/398 Pages) NUVOTON

343 / 398 page

M261/M262/M263

Mar 25, 2020

Page 343 of 398

Rev 1.02

Note:

Maximum allowable current is a function of device maximum power dissipation.

2. This current consumption must be correctly distributed over all I/Os and control pins. The total output current must not

be sunk/sourced between two consecutive power supply pins.

3. A positive injection is caused by VIN>AVDD and a negative injection is caused by VIN<VSS. IINJ(PIN) must never be

exceeded. It is recommended to connect an overvoltage protection diode between the analog input pin and the voltage

supply pin.

Table 8.1-2 Current Characteristics

8.1.3

Thermal Characteristics

The average junction temperature can be calculated by using the following equation:

TJ = TA + (PD x

)



TA = ambient temperature (℃)



JA = thermal resistance junction-ambient (℃/Watt)



= sum of internal and I/O power dissipation

Symbol

Parameter

Min

Max

Unit

Operating Temperature

-40

105

C

Junction temperature

-40

125

TST

Storage Temperature

-65

150

Table 8.1-3 Thermal Characteristics

8.1.4

EMC Characteristics

8.1.4.1

Electrostatic Discharge (ESD)

For the Nuvoton MCU products, there are ESD protection circuits which built into chips to avoid any

damage that can be caused by typical levels of ESD.

8.1.4.2

Static Latchup

Two complementary static tests are required on six parts to assess the latchup

performance:



A supply overvoltage is applied to each power supply pin



A current injection is applied to each input, output and configurable I/O pin

8.1.4.3

Electrical Fast Transients (EFT)

In some application circuit compoment will produce fast and narrow high-frequency trasnients bursts

of narrow high-frequency transients on the power distribution system..



Inductive loads:

–

Relays, switch contactors

–

Heavy-duty motors when de-energized etc.

The fast transient immunity requirements for electronic products are defined in IEC 61000-4-4 by

International ElectrotechnicalCommission (IEC).

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