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LTM8045 Datasheet(PDF) 36 Page - Analog Devices |
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LTM8045 Datasheet(HTML) 36 Page - Analog Devices |
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36 / 54 page ![]() LTM4655 36 Rev. 0 For more information www.analog.com APPLICATIONS INFORMATION As a practical matter, it should be clear to the reader that no individual or sub-group of the four thermal resistance parameters defined by JESD51-12 or provided in the Pin Configuration section replicates or conveys normal oper- ating conditions of a µModule regulator. For example, in normal board-mounted applications, never does 100% of the device’s total power loss (heat) thermally conduct exclusively through the top or exclusively through bot- tom of the µModule package—as the standard defines for θJCtop and θJCbottom, respectively. In practice, power loss is thermally dissipated in both directions away from the package—granted, in the absence of a heat sink and airflow, a majority of the heat flow is into the board. Within the LTM4655, be aware there are multiple power devices and components dissipating power, with a con- sequence that the thermal resistances relative to differ- ent junctions of components or die are not exactly linear with respect to total package power loss. To reconcile this complication without sacrificing modeling simplicity— but also not ignoring practical realities—an approach has been taken using FEA software modeling along with labo- ratory testing in a controlled-environment chamber to rea- sonably define and correlate the thermal resistance values supplied in this data sheet: (1) Initially, FEA software is used to accurately build the mechanical geometry of the LTM4655 and the specified PCB with all of the correct material coefficients along with accurate power loss source definitions; (2) this model simulates a software- defined JEDEC environment consistent with JESD51-9 and JESD51-12 to predict power loss heat flow and temperature readings at different interfaces that enable the calculation of the JEDEC-defined thermal resistance values; (3) the model and FEA software is used to evaluate the LTM4655 with heat sink and airflow; (4) having solved for and analyzed these thermal resistance values and simulated various operating conditions in the software model, a thorough laboratory evaluation replicates the simulated conditions with thermocouples within a con- trolled environment chamber while operating the device at the same power loss as that which was simulated. The outcome of this process and due diligence yields the set of derating curves provided in later sections of this data sheet, along with well-correlated JESD51-12-defined θ values provided in the Pin Configuration section. For positive-VOUT applications, the 12VIN and 24VIN power loss curves in Figure 11 and Figure 12, respectively, can be used with the load current derating curves in Figure 13 to Figure 24 for calculating an approximate θJA thermal resistance for the LTM4655 with various heat sinking and air flow conditions. For negative-VOUT applications: use instead the –5VOUT, –12VOUT and –24VOUT power loss curves in Figure 25 to Figure 27, respectively, in combination with the load current derating curves in Figure 28 to Figure 43. For split-supply applications, total power loss within the module will dictate the thermal derating; interpolate the relevant derating curves. These thermal resistances represent demonstrated performance of the LTM4655 on DC2898A and DC2899A hardware; 4-layer FR4 PCB measuring 97mm × 116mm × 1.6mm using outer and inner copper weights of 2oz and 1oz, Figure 10. Graphical Representation of JESD51-12 Thermal Coefficients 4655 F10 µModule DEVICE θJCtop JUNCTION-TO-CASE (TOP) RESISTANCE θJA JUNCTION-TO-AMBIENT RESISTANCE CASE (TOP)-TO-AMBIENT RESISTANCE BOARD-TO-AMBIENT RESISTANCE θJCbot JUNCTION-TO-CASE (BOTTOM) RESISTANCE JUNCTION AMBIENT CASE (BOTTOM)-TO-BOARD RESISTANCE |
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