LTM8045 datasheet(23/54 Pages) AD

23 / 54 page

LTM4655

Rev. 0

For more information www.analog.com

Test Circuit 3. Clock-Generator, 5V LDO and Temperature-Sensor

TEST CIRCUIT

APPLICATION

SYMBOL

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

Positive-VOUT Operation

(Noninverting Step-Down)

(Test Circuit 1)

CINHn, CDn

External High Frequency Input Capacitor Requirement,

27V ≤ VIN1–GND1 ≤40V, VOUT+ = 24V

IOUT+ = 4A

9.4

μF

COUTHn

External High Frequency Output Capacitor Requirement

27V ≤ VIN1–GND1 ≤ 40V, VOUT+ = 24V

IOUT+ = 4A

μF

Negative-VOUT– Operation

(Inverting Output Buck-Boost)

(Test Circuit 2)

CINHn, CDn

External High Frequency Input Capacitor Requirement,

3.6V ≤VIN2–GND2 ≤ 16V, VOUT– = –24V

IOUT– = 2A

9.4

μF

COUTHn

External High Frequency Output Capacitor Requirement

3.6V ≤ VIN2–GND2 ≤ 16V, VOUT– = –24V

IOUT– = 2A

μF

DECOUPLING REQUIREMENTS

TA = 25°C. Refer to Test Circuit 1 and Test Circuit 2.

LTM4655

0.1 F

VIN

4.5V

TO 40V

4655 TC03

PINS NOT SHOWN AND NOT TESTED

IN THIS TEST CIRCUIT:

VINn, SVINn, SVINFn, VDn, RUNn, VOUTn+,

VOSNSn+, VOUTn–, SVOUTn–, CLKINn,

INTVCCn, EXTVCCn, VINREGn, COMPna,

COMP

nb, fSETn, ISETna, ISETnb, IMONna,

IMON

nb, PGDFBn, PGOODn, NC

TEMP–

LDOIN

GND

LDOOUT

CLKSET

CLKOUT1

CLKOUT2

MOD

TEMP+

RCLKSET

LTM8045 Datasheet(PDF) 23 Page - Analog Devices

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