LTM8045 datasheet(9/54 Pages) AD

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LTM4655

Rev. 0

For more information www.analog.com

SYMBOL

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

LDOIN(DC)

LDO Input DC Voltage

4.5

VLDOOUT(DC)

LDO Output Voltage

VLDOIN = 36V, 0mA ≤ ILDOOUT ≤ 25mA

VLDOIN = 4.5V, 0mA ≤ ILDOOUT ≤ 20mA

4.8

2.7

5.0

4.1

5.2

VLDOOUT(AC)

Output Voltage Ripple

mVP-P

ILDOOUT(OCL)

Output Current Limit, 5V LDO

LDOIN = 36V

140

Clock Generator

∆fOUT

Clock-Generator Frequency Accuracy

2.7V ≤ LDOOUT ≤ 5.2V, 200kHz ≤ fOUT ≤ 3MHz,

MOD Connected to CLKOUT2

±2.5

±7.5

±3

RCLKSET(RANGE) Frequency Setting Resistor Range

RCLKSET Resistance for Which –7.5% ≤ ∆fOUT ≤

7.5%, Over 2.7V ≤ LDOOUT ≤ 5.2V,

MOD Electrically Connected to CLKOUT2

33.2

499

kΩ

Period Variation (Frequency Spreading)

LDOOUT = 5V, RCLKSET = 100kΩ, MOD Open Circuit

±10

Duty Cycle

2.7V ≤ LDOOUT ≤ 5.2V, 200kHz ≤ fOUT ≤ 3MHz,

MOD Electrically Connected to CLKOUT2

θCLKOUT1/

θCLKOUT2

Phase Relationship of CLKOUT2 to

CLKOUT1

2.7V ≤ LDOOUT ≤ 5.2V, 200kHz ≤ fOUT ≤ 3MHz,

MOD Electrically Connected to CLKOUT2

180

Deg

VOH_CLKOUTn

CLKOUT

n Output Voltage, Logic High

CLKOUT

n VOH Measured with Respect to LDOOUT,

2.7V ≤ LDOOUT ≤ 5.2V, ICLKOUTn = –100μA

–0.4

VOL_CLKOUTn

CLKOUT

n Output Voltage, Logic Low

CLKOUT

n VOL Measured with Respect to GND, 2.7V

≤ LDOOUT ≤ 5.2V, ICLKOUTn = 100μA

0.4

Temperature Sensor

∆VTEMP

Temperature Sensor Forward Voltage,

VTEMP+ to VTEMP–

ITEMP+ = 100µA and ITEMP– = –100μA at TA = 25°C

0.598

TC∆V(TEMP)

∆VTEMP Temperature Coefficient

–2.0

mV/°C

Ideality Factor

1.004

ELECTRICAL CHARACTERISTICS The

denotes the specifications which apply over the specified internal

operating temperature range (Note 2). TA = 25°C, Test Circuit 3 and voltages referred to GND unless otherwise noted.

Note 1: Stresses beyond those listing under Absolute Maximum Ratings

may cause permanent damage to the device. Exposure to any Absolute

Maximum Rating conditions for extended periods may affect device

reliability and lifetime.

Note 2: The LTM4655 is tested under pulsed load conditions such that TJ ≈

TA. The LTM4655E is guaranteed to meet performance specifications over the

0°C to 125°C internal operating temperature range. Specifications over the full

–40°C to 125°C internal operating temperature range are assured by design,

characterization and correlation with statistical process controls.

The LTM4655I is guaranteed to meet specifications over the full –40°C to

125°C internal operating temperature range. The LTM4655MP is tested and

guaranteed over the full –55°C to 125°C operating temperature range. Note

that the maximum ambient temperature consistent with these specifications is

determined by specific operating conditions in conjunction with board layout,

the rated package thermal resistance and other environmental factors.

Note 3: See output current derating curves for different VIN, VOUT, and TA,

located in the Applications Information section.

Note 4: Minimum on-time, PGOOD delay, and EXTVCCn switchover

threshold are tested at wafer sort.

Note 5: The two power inputs—VIN1 and VIN2—and their respective power

outputs—VOUT1+ or VOUT1–, and VOUT2+ or VOUT2–, depending on operational

configuration—are tested independently in production, in both positive-VOUT

(noninverting step-down) and negative-VOUT– (inverting buck-boost) configurations.

On occasion, a shorthand notation is used in this document that allows VINn torefer

to both VIN1 and VIN2 by virtue of n being permitted to take on a value of 1 or 2. This

italicized

n notation and convention is extended to all such pin names.

Note 6: To ensure minimum on-time criteria is met, VOUTn (0.5VDC)+ high

line regulation is tested at 13.2VIN, with fSETn and CLKINn open circuit.

VOUTn (–0.5VDC)– low line regulation is tested at 3.6VIN, with fSETn and

CLKIN

n open circuit.

VOUTn (–0.5VDC)– high line regulation is tested at 28VIN, and with CLKINn

driven at 200kHz—so as to ensure minimum on-time criteria is met.

The LTM4655 is not recommended for applications where the minimum

on-time criteria (guardband to 90ns) is continuously violated. The

LTM4655 can ride through events (such as VIN surge) where the on-time

criteria is transiently violated. See the Applications Information section.

Note 7: See the Applications Information section for dropout criteria.

Note 8: VOUTn (–24VDC)– is tested at 3.6VIN and 16VIN, with CLKINn

driven with a 1.8MHz clock, ISET

na to SVOUTn– = 12V, and RfSET = 57.6k.

It is also tested at 12VIN, with CLKINn driven with a 1.5MHz clock, RfSETn

= 57.6k, and RISETn = 480k.

Note 9: This IC includes overtemperature protection that is intended

to protect the device during momentary overload conditions. Junction

temperature will exceed 125°C when overtemperature protection is active.

Continuous operation above the specified maximum operating junction

temperature may impair device reliability.

Note 10: The INTVCCn Abs Max peak output current is specified as the sum

of current drawn by circuits internal to the module biased off of INTVCCn

and current drawn by external circuits biased off of INTVCCn. Specified

independently, for each channel. See the Applications Information section.

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