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MPC8540 Datasheet(PDF) 359 Page - Freescale Semiconductor, Inc |
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MPC8540 Datasheet(HTML) 359 Page - Freescale Semiconductor, Inc |
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359 / 1302 page ![]() External Signal Descriptions MPC8540 PowerQUICC III Integrated Host Processor Reference Manual, Rev. 1 Freescale Semiconductor 9-5 9.3.2 Detailed Signal Descriptions The following sections describe the DDR SDRAM controller input and output signals, the meaning of their different states, and relative timing information for assertion and negation. 9.3.2.1 Memory Interface Signals Table 9-3 describes the DDR controller memory interface signals. Table 9-3. Memory Interface Signals—Detailed Signal Descriptions Signal(s) I/O Description MDQ[0:63] I/O Data bus. Both input and output signals on the DDR memory controller. O As outputs for the bidirectional data bus, these signals operate as described below. State Meaning Asserted/Negated—Represent the value of data being driven by the DDR memory controller. Timing Assertion/Negation—Driven coincident with corresponding data strobes (MDQS) signal. High-impedance—No READ or WRITE command is in progress; data is not being driven by the memory controller or the DRAM. I As inputs for the bidirectional data bus, these signals operate as described below. State Meaning Asserted/Negated—Represents the state of data being driven by the external DDR SDRAMs. Timing Assertion/Negation—The DDR DIMM drives data during a READ transaction. High-impedance—No READ or WRITE command in progress; data is not being driven by the memory controller or the DRAM. MDQS[0:8] I/O Data strobes. Inputs with read data and as outputs with write data. O As outputs, the data strobes are driven by the DDR memory controller during a write transaction. The memory controller always drives these signals low unless a read has been issued and incoming data strobes are expected. This keeps the data strobes from floating high when there are no transactions on the DRAM interface. State Meaning Asserted/Negated—Driven high when positive capture data is transmitted/received and driven low when negative capture data is transmitted/received. Centered in the data “eye” for writes; coincident with the data eye for reads. Treated as a clock. Data is valid when signals toggle. See Table 9-25 for byte lane assignments. Timing Assertion/Negation—If a WRITE command is registered at clock edge n, data strobes at the DRAM assert centered in the data “eye” on clock edge n + 1. See the JEDEC DDR SDRAM specification for more information. I As inputs, the data strobes are driven by the external DDR SDRAMs during a read transaction. The data strobes are used by the memory controller to synchronize data latching. State Meaning Asserted/Negated—Driven high when positive capture data is transmitted/received and driven low when negative capture data is transmitted/received. Centered in the data “eye” for writes; coincident with the data eye for reads. Treated as a clock. Data is valid when signals toggle. See Table 9-25 for byte lane assignments. Timing Assertion/Negation—If a READ command is registered at clock edge n, and the latency is programmed in TIMING_CFG_1[CASLAT] to be m clocks, data strobes at the DRAM assert coincident with the data on clock edge n+ m. See the JEDEC DDR SDRAM specification for more information. |
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