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DSP56300FM/AD Datasheet(PDF) 49 Page - NXP Semiconductors |
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DSP56300FM/AD Datasheet(HTML) 49 Page - NXP Semiconductors |
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49 / 120 page ![]() 2-19 AC Electrical Characteristics Table 2-11. DRAM Page Mode Timings, Four Wait States1, 2, 3 No. Characteristics Symbol Expression 80 MHz 100 MHz Unit Min Max Min Max 131 Page mode cycle time for two consecutive accesses of the same direction Page mode cycle time for mixed (read and write) accesses tPC 5 × T C 4.5 × T C 62.5 56.2 — — 50.0 45.0 — — ns ns 132 CAS assertion to data valid (read) tCAC 2.75 × T C − 5.7 — 28.7 — 21.8 ns 133 Column address valid to data valid (read) tAA 3.75 × T C − 5.7 — 41.2 — 31.8 ns 134 CAS deassertion to data not valid (read hold time) tOFF 0.0 — 0.0 — ns 135 Last CAS assertion to RAS deassertion tRSH 3.5 × T C − 4.0 39.8 — 31.0 — ns 136 Previous CAS deassertion to RAS deassertion tRHCP 6 × T C − 4.0 71.0 — 56.0 — ns 137 CAS assertion pulse width tCAS 2.5 × T C − 4.0 27.3 — 21.0 — ns 138 Last CAS deassertion to RAS assertion5 • BRW[1–0] = 00 • BRW[1–0] = 01 • BRW[1–0] = 10 • BRW[1–0] = 11 tCRP Not supported 4.25 × T C − 6.0 5.25 × T C − 6.0 7.25 × T C − 6.0 — 47.2 59.6 84.6 — — — — — 36.5 46.5 66.5 — — — — ns ns ns ns 139 CAS deassertion pulse width tCP 2 × T C − 4.0 21.0 — 16.0 — ns 140 Column address valid to CAS assertion tASC TC − 4.0 8.5 — 6.0 — ns 141 CAS assertion to column address not valid tCAH 3.5 × T C − 4.0 39.8 — 31.0 — ns 142 Last column address valid to RAS deassertion tRAL 5 × T C − 4.0 58.5 — 46.0 — ns 143 WR deassertion to CAS assertion tRCS 1.25 × T C − 4.0 11.8 — 8.5 — ns 144 CAS deassertion to WR assertion tRCH 1.25 × T C – 3.7 11.9 — 8.8 — ns 145 CAS assertion to WR deassertion tWCH 3.25 × T C − 4.2 36.4 — 28.3 — ns 146 WR assertion pulse width tWP 4.5 × T C − 4.5 51.8 — 40.5 — ns 147 Last WR assertion to RAS deassertion tRWL 4.75 × T C − 4.3 55.1 — 43.2 — ns 148 WR assertion to CAS deassertion tCWL 3.75 × T C − 4.3 42.6 — 33.2 — ns 149 Data valid to CAS assertion (write) tDS 0.5 × T C – 4.8 1.5 — 0.2 — ns 150 CAS assertion to data not valid (write) tDH 3.5 × T C − 4.0 39.8 — 31.0 — ns 151 WR assertion to CAS assertion tWCS 1.25 × T C − 4.3 11.3 — 8.2 — ns 152 Last RD assertion to RAS deassertion tROH 4.5 × T C − 4.0 52.3 — 41.0 — ns 153 RD assertion to data valid tGA 3.25 × T C − 5.7 — 34.9 — 26.8 ns 154 RD deassertion to data not valid6 tGZ 0.0 — 0.0 — ns 155 WR assertion to data active 0.75 × T C – 1.5 7.9 — 6.0 — ns 156 WR deassertion to data high impedance 0.25 × T C —3.1 —2.5 ns Notes: 1. The number of wait states for Page mode access is specified in the DCR. 2. The refresh period is specified in the DCR. 3. The asynchronous delays specified in the expressions are valid for DSP56305. 4. All the timings are calculated for the worst case. Some of the timings are better for specific cases (for example, tPC equals 3 × T C for read-after-read or write-after-write sequences). 5. BRW[1–0] (DRAM control register bits) defines the number of wait states that should be inserted in each DRAM out-of-page access. N/A = does not apply because 100 MHz requires a minimum of three wait states. 6. RD deassertion always occurs after CAS deassertion; therefore, the restricted timing is tOFF and not tGZ. Freescale Semiconductor, Inc. For More Information On This Product, Go to: www.freescale.com |
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