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ADS5546 Datasheet(PDF) 8 Page - Texas Instruments

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Part # ADS5546
Description  14-BIT, 190 MSPS ADC WITH DDR LVDS/CMOS OUTPUTS
PDF  50 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

ADS5546 Datasheet(HTML) 8 Page - Texas Instruments

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ADS5546
SLWS183C – NOVEMBER 2005 – REVISED OCTOBER 2006
TIMING CHARACTERISTICS – LVDS AND CMOS MODES (continued)
For timings at lower sampling frequencies, see the Output Timing section in the APPLICATION INFORMATION of this data
sheet.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Duty cycle of differential clock,
LVDS bit clock duty cycle
(CLKOUTP-CLKOUTM)
45%
50%
55%
80
≤ Fs ≤ 190 MSPS
Rise time measured from –50 mV to 50 mV
tr ,
Data rise time,
Fall time measured from 50 mV to –50 mV
50
100
200
ps
tf
Data fall time
1
≤ Fs ≤ 190 MSPS
Rise time measured from –50 mV to 50 mV
tCLKRISE,
Output clock rise time,
Fall time measured from 50 mV to –50 mV
50
100
200
ps
tCLKFALL
Output clock fall time
1
≤ Fs ≤ 190 MSPS
Output enable (OE) to valid data
tOE
Time to valid data after OE becomes active
1
µs
delay
PARALLEL CMOS MODE
tsu
Data setup time (5)
Data valid(7) to 50% of CLKOUT rising edge
2.2
3
ns
50% of CLKOUT rising edge to data becoming
th
Data hold time (5)
0.5
0.9
ns
invalid(7)
Input clock rising edge zero-cross to 50% of
tPDI
Clock propagation delay
2.4
3.2
4
ns
CLKOUT rising edge
Duty cycle of output clock (CLKOUT)
Output clock duty cycle
45%
80
≤ Fs ≤ 190 MSPS
Rise time measured from 20% to 80% of
DRVDD
tr,
Data rise time,
Fall time measured from 80% to 20% of
0.8
1.5
2
ns
tf
Data fall time
DRVDD
1
≤ Fs ≤ 190 MSPS
Rise time measured from 20% to 80% of
DRVDD
tCLKRISE,
Output clock rise time,
Fall time measured from 80% to 20% of
0.4
0.8
1.2
ns
tCLKFALL
Output clock fall time
DRVDD
1
≤ Fs ≤ 190 MSPS
Output enable (OE) to valid data
tOE
Time to valid data after OE becomes active
50
ns
delay
(7)
Data valid refers to logic high of 2 V and logic low of 0.8 V
8
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