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PCD6001 Datasheet(PDF) 64 Page - NXP Semiconductors |
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PCD6001 Datasheet(HTML) 64 Page - NXP Semiconductors |
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64 / 96 page ![]() 2001 Apr 17 64 Philips Semiconductors Product specification Digital telephone answering machine chip PCD6001 14 ANALOG VOLTAGE REFERENCE (AVR) 14.1 Bandgap reference The Analog Voltage Reference circuitry (AVR) includes a bandgap circuit with a nominal output voltage of about 1.25 V. This voltage is used by the power-on reset block and by the analog voltage source to generate the reference voltage VREF. Block AVR is always on, even in System-off mode, and will consume only a few µA of current. The output of AVR is directly connected to the power-on reset block and it determines the power-on reset threshold levels accuracy in first order. The connection from AVR to the analog voltage source circuitry (AVS, see Section 14.2) is via an internal series resistor of about 500 k Ω (typical). The voltage after this resistor is connected to pin VBGP, which allows an external capacitor (100 nF) to be connected to filter out any noise from AVR otherwise entering AVS. With this configuration the noise at pin VBGP will be about −115 dBmp. The pin also allows a direct measurement of the bandgap voltage, but no current must be drawn. In order to guarantee a correct start-up of the bandgap voltage under all conditions, a supply voltage ramp test is performed on each device. The bandgap voltage is compared against specified values at the indicated times (see Fig.30). The test setup intends to reflect the worst case start-up conditions which may occur in an application (for initial power-up and after short power drop). Note that trise is critical and should not be greater than indicated in a given application. Other indicated times (tsettle and trise) reflect the worst case conditions for the device and therefore can change in the application. handbook, full pagewidth MGT445 tfall tsettle trise t measure VBGP VDDA 0 V 0.6 V 2.5 V tfall = 2 ms tsettle = 45 ms trise = 20 ms Fig.30 Bandgap voltage test setup. |
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