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H838024 Datasheet(PDF) 195 Page - Renesas Technology Corp |
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H838024 Datasheet(HTML) 195 Page - Renesas Technology Corp |
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195 / 697 page ![]() Section 6 ROM Rev. 7.00 Mar 10, 2005 page 153 of 652 REJ09B0042-0700 6.4 Reliability of Programmed Data A highly effective way to improve data retention characteristics is to bake the programmed chips at 150°C, then screen them for data errors. This procedure quickly eliminates chips with PROM memory cells prone to early failure. Figure 6.6 shows the recommended screening procedure. Program chip and verify programmed data Bake chip for 24 to 48 hours at 125 °C to 150°C with power off Read and check program Install Figure 6.6 Recommended Screening Procedure If a series of programming errors occurs while the same PROM programmer is in use, stop programming and check the PROM programmer and socket adapter for defects. Please inform Renesas Technology of any abnormal conditions noted during or after programming or in screening of program data after high-temperature baking. |
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