LTC6801 datasheet(17/28 Pages) AD

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LTC6801

Rev. F

For more information www.analog.com

6801 F06

LTC6801

SLT

HYST

UV0

CC1

CC0

SLTOK

OV0

VREF

VTEMP2

VREG

OV1

UV1

EIN

SOUT

EIN

VTEMP1

EOUT

SIN

C10

C11

C12

V+

ZCLAMP

V–

APPLICATIONS INFORMATION

Figure 5. Using Fuses and Diodes for Cell Input

Protection (One Cell Connection Shown)

6801 F05

PROTECT

AGAINST

BREAKS

HERE

Cn – 1

stress on the IC inputs. The diodes used in this situation

need current ratings sufficient to open the protective fuse

in the battery tap signal.

Internal Protection Structure

The LTC6801 incorporates a number of protective struc-

tures, including parasitic diodes, Zener-like overvoltage

suppressors, and other internal features that provide

protection against ESD and certain overstress conditions

that could arise in practice. Figure 6 shows a simplified

internal schematic that indicates the significant protec-

tive structures and their connectivity. The various diodes

indicate the approximate current versus voltage charac-

teristics that are intrinsic to the part, which is useful in

analyzing responses to certain external stresses, such as

during a hot-start scenario.

SELF TEST CIRCUITRY

The LTC6801 has internal circuitry that performs a peri-

odic self test of all measurement functions. The LTC6801

self test circuitry is intended to prevent undetectable

failure modes. Accuracy and functionality of the voltage

reference and comparator are verified, as well as function-

ality of the high voltage multiplexer and ADC decimation

Figure 6. Internal Protection Structures

LTC6801 Datasheet(PDF) 17 Page - Analog Devices

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