TCM4400EPET datasheet(36/64 Pages) TI

36 / 64 page

TCM4400E

GSM/DCS BASEBAND AND VOICE A/D

AND D/A RF INTERFACE CIRCUIT

SLWS082A – JULY 1999 – REVISED MARCH 2000

POST OFFICE BOX 655303

• DALLAS, TEXAS 75265

PRINCIPLES OF OPERATION

JTAG interface

TCM4400E provides a JTAG interface according to IEEE Std1149.1. This interface uses five dedicated IOs:

TCK (test clock), TMS (test mode select), TDI (scan input), TDO (scan output), and TRST (test reset). Inputs

TMS,TDI, and TRST contain a pullup device which makes their state high when they are not driven. Output TDO

is a 3-state output which is Hi-Z except when data are shifted between TDI and TDO. TRST input is intended

for proper initialization of the state machine test access port (TAP) and boundary scan cells. System RESET

is sent into the device through a boundary-scan register, which has to be initialized by TRST to allow the RESET

signal to be propagated into the device; a good practice should be to connect RESET and TRST terminals

together.

standard user instructions available.

NAME

OPCODE

DESCRIPTION

BYPASS

11111

Connects the by-pass register between TDI and TDO.

SAMPLE/PRELOAD

00010

Connects the boundary scan register between TDI and TDO. This mode captures a snapshot of the state

of the digital I/Os of the device.

EXTEST

00000

Connects the boundary scan register between TDI and TDO. This mode captures the state of the input

terminals and forces the state of the output pins. This mode is intended for printed-circuit board

connections testing between devices.

IDCODE

00001

Connects the identification register between TDI and TDO. This is the default configuration at reset.

INTEST

00011

Connects the boundary scan register between TDI and TDO. This mode forces the internal system input

signals via the parallel latches of the boundary register and captures internal system outputs. The mode

performs device internal tests independently of the state of its input terminals. In this mode the internal

system master clock is derived from TCK and is active in the run-test-idle state of the state machine to

allow step-by-step operation of the device.

JTAG interface scan chains description

bypass register

TDI

TDO

instruction register

TDI

TDO

identification register

TDI

TDO

765

TCM4400EPET Datasheet(PDF) 36 Page - Texas Instruments

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