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ADS4128 Datasheet(PDF) 13 Page - Texas Instruments |
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ADS4128 Datasheet(HTML) 13 Page - Texas Instruments |
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13 / 61 page ![]() Dn_Dn+1_P Dn_Dn+1_M GND Logic0 V ODL Logic1 V ODH V OCM ADS4128 www.ti.com SBAS578 – MAY 2012 TIMING CHARACTERISTICS (1) With external 100- Ω termination. Figure 4. LVDS Output Voltage Levels TIMING REQUIREMENTS: LVDS and CMOS Modes (1) Typical values are at +25°C, AVDD = 1.8 V, DRVDD = 1.8 V, sampling frequency = 200 MSPS, sine wave input clock, CLOAD = 5 pF (2), and R LOAD = 100 Ω (3), unless otherwise noted. Minimum and maximum values are across the full temperature range: TMIN = –40°C to TMAX = +85°C, AVDD = 1.8 V, and DRVDD = 1.7 V to 1.9 V. PARAMETER CONDITIONS MIN TYP MAX UNIT tA Aperture delay 0.6 0.8 1.2 ns Between two devices at the same temperature and DRVDD Aperture delay variation ±100 ps supply tJ Aperture jitter 100 fS rms Time to valid data after coming out of STANDBY mode 5 25 µs Wakeup time Time to valid data after coming out of PDN GLOBAL mode 100 500 µs Clock Low-latency mode (default after reset) 10 cycles Low-latency mode disabled Clock ADC latency(4) 16 (gain enabled, offset correction disabled) cycles Low-latency mode disabled Clock 17 (gain and offset correction enabled) cycles DDR LVDS MODE(5)(6) tSU Data setup time(3) Data valid(7) to zero-crossing of CLKOUTP 1.05 1.55 ns tH Data hold time(3) Zero-crossing of CLKOUTP to data becoming invalid(7) 0.35 0.6 ns Input clock rising edge crossover to output clock rising edge tPDI Clock propagation delay crossover 3 4.2 5.4 ns 1 MSPS ≤ sampling frequency ≤ 200 MSPS Between two devices at the same temperature and DRVDD Variation of tPDI ±0.6 ns supply (1) Timing parameters are ensured by design and characterization but are not production tested. (2) CLOAD is the effective external single-ended load capacitance between each output pin and ground. (3) RLOAD is the differential load resistance between the LVDS output pair. (4) At higher frequencies, tPDI is greater than one clock period and overall latency = ADC latency + 1. (5) Measurements are done with a transmission line of 100- Ω characteristic impedance between the device and the load. Setup and hold time specifications take into account the effect of jitter on the output data and clock. (6) The LVDS timings are unchanged for low latency disabled and enabled. (7) Data valid refers to a logic high of 1.26 V and a logic low of 0.54 V. Copyright © 2012, Texas Instruments Incorporated Submit Documentation Feedback 13 Product Folder Link(s): ADS4128 |
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