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TMS320VC5509 Datasheet(PDF) 28 Page - Texas Instruments

Part # TMS320VC5509
Description  Fixed-Point Digital Signal Processor
PDF  122 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

TMS320VC5509 Datasheet(HTML) 28 Page - Texas Instruments

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Introduction
28
April 2001 − Revised September 2004
SPRS163G
Table 2−3. Signal Descriptions (Continued)
TERMINAL
NAME
RESET
CONDITION
BK‡
FUNCTION
I/O/Z†
MULTIPLEXED
SIGNAL NAME
TEST/EMULATION PINS
TCK
I
IEEE standard 1149.1 test clock. TCK is normally a free-running clock
signal with a 50% duty cycle. The changes on test access port (TAP) of
input signals TMS and TDI are clocked into the TAP controller, instruction
register, or selected test data register on the rising edge of TCK. Changes
at the TAP output signal (TDO) occur on the falling edge of TCK.
PU
H
Input
TDI
I
IEEE standard 1149.1 test data input. Pin with internal pullup device. TDI is
clocked into the selected register (instruction or data) on a rising edge of
TCK.
PU
Input
TDO
O/Z
IEEE standard 1149.1 test data output. The contents of the selected
register (instruction or data) are shifted out of TDO on the falling edge of
TCK. TDO is in the high-impedance state except when the scanning of
data is in progress.
Hi-Z
TMS
I
IEEE standard 1149.1 test mode select. Pin with internal pullup device.
This serial control input is clocked into the TAP controller on the rising edge
of TCK.
PU
Input
TRST
I
IEEE standard 1149.1 test reset. TRST, when high, gives the IEEE
standard 1149.1 scan system control of the operations of the device. If
TRST is not connected or driven low, the device operates in its functional
mode, and the IEEE standard 1149.1 signals are ignored. This pin has an
internal pulldown.
PD
Input
EMU0
I/O/Z
Emulator 0 pin. When TRST is driven low, EMU0 must be high for
activation of the OFF condition. When TRST is driven high, EMU0 is used
as an interrupt to or from the emulator system and is defined as I/O by way
of the IEEE standard 1149.1 scan system.
PU
Input
EMU1/OFF
I/O/Z
Emulator 1 pin/disable all outputs. When TRST is driven high, EMU1/OFF
is used as an interrupt to or from the emulator system and is defined as I/O
by way of IEEE standard 1149.1 scan system. When TRST is driven low,
EMU1/OFF is configured as OFF. The EMU1/OFF signal, when
active-low, puts all output drivers into the high-impedance state. Note that
OFF is used exclusively for testing and emulation purposes (not for
multiprocessing applications). Therefore, for the OFF condition, the
following apply: TRST = low, EMU0 = high, EMU1/OFF = low
PU
Input
† I = Input, O = Output, S = Supply, Hi-Z = High-impedance
‡ BK = bus keeper (the bus keeper maintains the previous voltage level during reset or while the output pin is not driven), PU = pullup,
PD = pulldown, H = hysteresis input buffer



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