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TMS320VC5509 Datasheet(PDF) 28 Page - Texas Instruments |
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TMS320VC5509 Datasheet(HTML) 28 Page - Texas Instruments |
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28 / 122 page ![]() Introduction 28 April 2001 − Revised September 2004 SPRS163G Table 2−3. Signal Descriptions (Continued) TERMINAL NAME RESET CONDITION BK‡ FUNCTION I/O/Z† MULTIPLEXED SIGNAL NAME TEST/EMULATION PINS TCK I IEEE standard 1149.1 test clock. TCK is normally a free-running clock signal with a 50% duty cycle. The changes on test access port (TAP) of input signals TMS and TDI are clocked into the TAP controller, instruction register, or selected test data register on the rising edge of TCK. Changes at the TAP output signal (TDO) occur on the falling edge of TCK. PU H Input TDI I IEEE standard 1149.1 test data input. Pin with internal pullup device. TDI is clocked into the selected register (instruction or data) on a rising edge of TCK. PU Input TDO O/Z IEEE standard 1149.1 test data output. The contents of the selected register (instruction or data) are shifted out of TDO on the falling edge of TCK. TDO is in the high-impedance state except when the scanning of data is in progress. Hi-Z TMS I IEEE standard 1149.1 test mode select. Pin with internal pullup device. This serial control input is clocked into the TAP controller on the rising edge of TCK. PU Input TRST I IEEE standard 1149.1 test reset. TRST, when high, gives the IEEE standard 1149.1 scan system control of the operations of the device. If TRST is not connected or driven low, the device operates in its functional mode, and the IEEE standard 1149.1 signals are ignored. This pin has an internal pulldown. PD Input EMU0 I/O/Z Emulator 0 pin. When TRST is driven low, EMU0 must be high for activation of the OFF condition. When TRST is driven high, EMU0 is used as an interrupt to or from the emulator system and is defined as I/O by way of the IEEE standard 1149.1 scan system. PU Input EMU1/OFF I/O/Z Emulator 1 pin/disable all outputs. When TRST is driven high, EMU1/OFF is used as an interrupt to or from the emulator system and is defined as I/O by way of IEEE standard 1149.1 scan system. When TRST is driven low, EMU1/OFF is configured as OFF. The EMU1/OFF signal, when active-low, puts all output drivers into the high-impedance state. Note that OFF is used exclusively for testing and emulation purposes (not for multiprocessing applications). Therefore, for the OFF condition, the following apply: TRST = low, EMU0 = high, EMU1/OFF = low PU Input † I = Input, O = Output, S = Supply, Hi-Z = High-impedance ‡ BK = bus keeper (the bus keeper maintains the previous voltage level during reset or while the output pin is not driven), PU = pullup, PD = pulldown, H = hysteresis input buffer |
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