LP5523 datasheet(33/56 Pages) TI1

33 / 56 page

LP5523

www.ti.com

SNVS550D – SEPTEMBER 2009 – REVISED MAY 2013

NOTE

When writing temperature data outside the range of the temperature compensation:

Values greater than 89°C will be set to 89°C; values less than

−39°C will be set to

−39°C.

41 LED TEST CONTROL

•

LED test control register

–

41 — Bit [7] EN_LEDTEST_ADC

–

Writing this bit high (1) fires single LED test conversion. LED test measurement cycle is 2.7 milliseconds.

•

41 — Bit [6] EN_LEDTEST_INT

–

1 = interrupt signal will be sent to the INT pin when the LED test is accomplished.

–

0 = no interrupt signal will be sent to the INT pin when the LED test is accomplished.

–

Interrupt can be cleared by reading STATUS/INTERRUPT register 3A.

•

41 — Bit [5] CONTINUOUS_CONV

–

1 = continuous LED test measurement. Not active in power-save mode.

–

0 = continuous conversion is disabled.

•

41 — Bits [4:0] LED__TEST_CTRL

–

These bits are used for choosing the LED driver output to be measured. VDD , INT-pin and charge-pump

output voltage can be measured, also.

LED_TEST_CTRL bits

Measurement

00000

00001

00010

00011

00100

00101

00110

00111

01000

01001 to 01110

Reserved

01111

VOUT

10000

VDD

10001

INT-pin voltage

10010 to 11111

N/A

42 LED TEST ADC

•

42 — Bits [7:0] LED_TEST_ADC

–

This is used to store the LED test result. Read-only register. LED test ADC's least significant bit

corresponds to 30 mV. The measured voltage V (typ.) is calculated as follows: V = (RESULT(DEC) x 0.03

- 1.478 V. For example, if the result is 10100110 = 166(DEC), the measured voltage is 3.50V (typ.). See

the figure below.

Submit Documentation Feedback

Product Folder Links: LP5523

LP5523 Datasheet(PDF) 33 Page - Texas Instruments

LP5523 Datasheet(HTML) 33 Page - Texas Instruments

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56

Datasheet Download

Link URL