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AM29BDD160G Datasheet(PDF) 60 Page - Advanced Micro Devices |
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AM29BDD160G Datasheet(HTML) 60 Page - Advanced Micro Devices |
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60 / 80 page ![]() 58 Am29BDD160G TEST CONDITIONS Note: Diodes are IN3064 or equivalent Figure 12. Test Setup KEY TO SWITCHING WAVEFORMS KS000010-PAL SWITCHING WAVEFORMS Figure 13. Input Waveforms and Measurement Levels Table 25. Test Specifications Test Condition 54D, 64C 65A Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 100 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0 V – VIO V Input timing measurement reference levels VIO/2 V Output timing measurement reference levels VIO/2 V WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) VIO VSS |
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