 |
Electronic Components Datasheet Search |
|
|
Electronic Components Datasheet Search |
|
GD25Q257DFJR Datasheet(PDF) 82 Page - GigaDevice Semiconductor (Beijing) Inc. |
|
|
|||||||||||||||||||||||||||||
GD25Q257DFJR Datasheet(HTML) 82 Page - GigaDevice Semiconductor (Beijing) Inc. |
|
|
82 / 99 page  3.3V Uniform Sector Dual and Quad Serial Flash GD25Q257D 82 Figure 83. Input Test Waveform and Measurement Level 9.4. CAPACITANCE MEASUREMENT CONDITIONS Table 27. Capacitance Measurement Conditions Symbol Parameter Min. Typ. Max. Unit Conditions CIN Input Capacitance 6 pF VIN=0V COUT Output Capacitance 8 pF VOUT=0V CL Load Capacitance 30 pF Input Rise And Fall time 5 ns Input Pulse Voltage 0.1VCC to 0.8VCC V Input Timing Reference Voltage 0.2VCC to 0.7VCC V Output Timing Reference Voltage 0.5VCC V Figure 84. Input/Output Timing Reference Level Vss 20ns Maximum Negative Overshoot Waveform Maximum Positive Overshoot Waveform 20ns 20ns Vss-2.0V Vcc 20ns 20ns 20ns Vcc + 2.0V 0.8VCC 0.1VCC 0.7VCC 0.2VCC 0.5VCC AC Measurement Level Input timing reference level Output timing reference level Note: Input pulse rise and fall time are<5ns |
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
English ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
