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LTC4261 Datasheet(PDF) 39 Page - Analog Devices |
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LTC4261 Datasheet(HTML) 39 Page - Analog Devices |
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39 / 82 page ![]() LTC4284 39 Rev. B For more information www.analog.com APPLICATIONS INFORMATION Figure 18. Use PGIO4/EXT_FAULT to Turn Off MOSFET when Drain Temperature Exceeds 115°C Resetting Faults Faults are reset with any of the following conditions. First, writing zeros to FAULT register 0x04 will clear the associ- ated fault bits. Second, the entire FAULT register is cleared when the ON bit in CONTROL_1 register 0x0A goes from high to low, or if INTVCC falls below its 3.8V undervolt- age lockout. EN# falling from high to low also clears the entire FAULT register. Finally, when UVL is pulled below its 1.024V reset threshold, all fault bits in the FAULT register are cleared. When UVL is brought back above 1.024V but below 1.833V, the UV_FAULT bit is set if UVH is below 2.048V. This can be avoided by holding UVH above 2.048V while toggling UVL to reset faults. Fault bits with associated fault conditions that are still present (as indicated in FAULT_STATUS register 0x03) cannot be cleared. The FAULT register will not be cleared when auto-retrying. When auto-retry of a specific GATE turn-off fault is disabled using CONTROL_2 register 0x0B, the existence of the associated fault bit keeps the MOSFET off. After the fault bit is cleared and the associated retry delay expires, the MOSFETs are allowed to turn on again. If auto-retry of a fault is enabled, then a high state of the associated fault status bit in 0x03 will hold the MOSFETs off and the FAULT register is ignored. Subsequently, when the condition causing the fault is cleared (and so is the fault status bit in 0x03), the MOSFETs are allowed to turn on again. Alarms Besides the fault bits and the EN#_CHANGED bit, the LTC4284 also logs ADC alarms in ADC_ALARM_LOG registers 0x05-0x09 when ADC results are higher than the pre-configured MAX thresholds or lower than the C1 10nF RTH* 470 at 25°C 4.7k at 115°C R1 13.7k 1% INTVCC LTC4284 VEE PGIO4 TDK/EPCOS B59421A0115A062 *RTH PLACED NEAR MOSFET DRAIN 4284 F18 PGIO4_CONFIG = 01b EXTFLT_TURN_OFF = 1 pre-configured MIN thresholds. In addition, when the tick counter or energy meter overflows, the TICK_OVERFLOW bit or METER_OVERFLOW bit is logged into METER_ CONTROL register 0x84. Finally, when EEPROM is writ- ten through I2C, the EEPROM_WRITTEN bit is logged into ADC_ALARM_LOG register 0x05. Similar to the fault bits, these alarm bits indicate the history of corresponding conditions and do not reflect the present status of the conditions. Any alarm bit can only be reset by two meth- ods: writing a zero to the alarm bit using I2C or bringing INTVCC below its undervoltage lockout voltage. EN# Pin EN# has a 1.28V logic threshold relative to VEE with a maximum leakage current of 1μA at 3V. It must be pulled low and remain low during the 128ms debounce delay. When the delay expires, the MOSFETs are allowed to turn- on. An internal clamp limits EN# to a minimum of 6V. The pin can be safely connected to higher voltages through a resistor that limits the current up to 5mA. It can be used to monitor board present as shown in Figure 2. The EN# bit in SYSTEM_STATUS register 0x00 indicates the present state of EN#, and the EN#_CHANGED bit in ADC_ALARM_LOG_1 register 0x05 is set high whenever EN# changes state. The EN#_CHANGED bit can be cleared using the same methods as those for resetting faults (see Resetting Faults) except pulling EN# from high to low. Pulling EN# from high to low sets the EN#_CHANGED bit while clearing the entire FAULT register 0x04. ON Bit The ON bit in CONTROL_1 register 0x0A allows one to turn on (ON bit = 1) and turn off (ON bit = 0) the MOSFETs through the I2C interface. There is no debounce delay associated with this bit, so the MOSFETs are immediately turned on after the bit is flipped from 0 to 1 while all other turn-on conditions are met. When the ON bit is changed from 1 to 0, the MOSFETs are turned off and all bits in FAULT register 0x04 plus the EN#_CHANGED bit in ADC_ALARM_LOG_1 register 0x05 are cleared. |
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