ADA4523-1

Data Sheet

Rev. 0 | Page 6 of 29

Parameter

Symbol

Test Conditions/Comments

Min

Typ

Max

Unit

DYNAMIC PERFORMANCE

Gain Bandwidth Product

5

MHz

Slew Rate

Rising

SRRISE

AV = −1, RL = 10 kΩ

1.85

V/µs

Falling

SRFALL

AV = −1, RL = 10 kΩ

1.8

V/µs

Internal Chopping Frequency

fC

330

kHz

EMI Rejection Ratio +IN

EMIRR

Input voltage (VIN) = −10 dBm peak,

frequency (f) = 400 MHz

80

dB

VIN = −10 dBm peak, f = 900 MHz

140

dB

VIN = −10 dBm peak, f = 1800 MHz

90

dB

VIN = −10 dBm peak, f = 2400 MHz

94

dB

INPUT NOISE

Spectral Density

Current

in

1 kHz

1

pA/√Hz

Voltage

en

1 kHz

4.2

nV/√Hz

Voltage

en P-P

0.1 Hz to 10 Hz

88

nV p-p

en RMS

0.1 Hz to 10 Hz

13.3

nV rms

SHUTDOWN CHARACTERISTICS

−40°C ≤ TA ≤ +125°C

Shutdown Threshold (SD − SDCOM)

Low

VSDL

0.8

V

High

VSDH

2

V

SDCOM Voltage Range

−15

+12.65

V

SD Current

I

SD

V

SD − VSDCOM = 0 V

−1.5

−0.5

µA

SDCOM Current

ISDCOM

V

SD − VSDCOM = 0 V

3

6

µA

1

These parameters are guaranteed by design. Thermocouple effects preclude measurements of these voltage levels during automated testing. VOS is measured to a

limit determined by the test equipment capabilities.

2

The input bias current and input offset current are measured using an equivalent source impedance of 100 MΩ || 51 pF.