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LTC3707IGN Datasheet(PDF) 15 Page - Linear Technology |
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LTC3707IGN Datasheet(HTML) 15 Page - Linear Technology |
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15 / 32 page ![]() LTC3707 15 3707fb APPLICATIONS INFORMATION However, designs for surface mount are available that do not increase the height significantly. Power MOSFET and D1 Selection Two external power MOSFETs must be selected for each controller with the LTC3707: One N-channel MOSFET for the top (main) switch, and one N-channel MOSFET for the bottom (synchronous) switch. The peak-to-peak drive levels are set by the INTVCC voltage. This voltage is typically 5V during start-up (see EXTVCC Pin Connection). Consequently, logic-level threshold MOSFETs must be used in most applications. The only exception is if low input voltage is expected (VIN < 5V); then, sub-logic level threshold MOSFETs (VGS(TH) < 3V) should be used. Pay close attention to the BVDSS specification for the MOSFETs as well; most of the logic level MOSFETs are limited to 30V or less. Selection criteria for the power MOSFETs include the “ON” resistance RDS(ON),reversetransfercapacitanceCRSS,input voltage and maximum output current. When the LTC3707 is operating in continuous mode the duty cycles for the top and bottom MOSFETs are given by: Main Switch Duty Cycle = V OUT V IN Synchronous Switch Duty Cycle = V IN –VOUT V IN The MOSFET power dissipations at maximum output current are given by: P MAIN = V OUT V IN I MAX ()2 1+δ ()R DS(ON) + kV IN ()2 I MAX () C RSS () f() P SYNC = V IN –VOUT V IN I MAX ()2 1+δ ()R DS(ON) where δ is the temperature dependency of RDS(ON) and k is a constant inversely related to the gate drive current. Both MOSFETs have I2R losses while the topside N-channel equation includes an additional term for transition losses, which are highest at high input voltages. For VIN < 20V the high current efficiency generally improves with larger MOSFETs, while for VIN > 20V the transition losses rapidly increase to the point that the use of a higher RDS(ON)device with lower CRSS actually provides higher efficiency. The synchronous MOSFET losses are greatest at high input voltage when the top switch duty factor is low or during a short-circuit when the synchronous switch is on close to 100% of the period. The term (1+ δ) is generally given for a MOSFET in the form of a normalized RDS(ON) vs Temperature curve, but δ = 0.005/°C can be used as an approximation for low voltage MOSFETs. CRSS is usually specified in the MOSFET characteristics. The constant k = 1.7 can be used to esti- mate the contributions of the two terms in the main switch dissipation equation. The Schottky diode D1 shown in Figure 1 conducts dur- ing the dead-time between the conduction of the two power MOSFETs. This prevents the body diode of the bottom MOSFET from turning on, storing charge during the dead-time and requiring a reverse recovery period that could cost as much as 3% in efficiency at high VIN. A 1A to 3A Schottky is generally a good compromise for both regions of operation due to the relatively small aver- age current. Larger diodes result in additional transition losses due to their larger junction capacitance. Schottky diodes should be placed in parallel with the synchronous MOSFETs when operating in pulse-skip mode or in Burst Mode operation. CIN and COUT Selection The selection of CIN is simplified by the multiphase ar- chitecture and its impact on the worst-case RMS current drawn through the input network (battery/fuse/capacitor). It can be shown that the worst case RMS current occurs when only one controller is operating. The controller with the highest (VOUT)(IOUT) product needs to be used in the formula below to determine the maximum RMS current requirement. Increasing the output current, drawn from the other out-of-phase controller, will actually decrease the input RMS ripple current from this maximum value (see Figure 4). The out-of-phase technique typically reduces the input capacitor’s RMS ripple current by a factor of |
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