PCM1795 datasheet(2/58 Pages) TI

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ABSOLUTE MAXIMUM RATINGS

(1)

PCM1795

SLES248 – MAY 2009 ........................................................................................................................................................................................................ www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ORDERING INFORMATION(1)

SPECIFIED

PACKAGE-

PACKAGE

TEMPERATURE

PACKAGE

ORDERING

TRANSPORT MEDIA,

PRODUCT

LEAD

DESIGNATOR

RANGE

MARKING

NUMBER

QUANTITY

PCM1795DB

Tube

PCM1795

SSOP-28

–25°C to +85°C

PCM1795

PCM1795DBR

Tape and Reel

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

Over operating free-air temperature range, unless otherwise noted.

VALUE

UNIT

VCC1, VCC2L, VCC2R

–0.3 to +6.5

Supply voltage

VDD

–0.3 to +4

Supply voltage differences

VCC1, VCC2L, VCC2R

±0.1

Ground voltage differences

AGND1, AGND2, AGND3L, AGND3R, DGND

±0.1

LRCK, DATA, BCK, SCK, MSEL, RST, MS(2), MDI, MC,

–0.3 to +6.5

MDO(2), ZEROL(2), ZEROR(2)

Digital input voltage

ZEROL(3), ZEROR(3), MDO(3), MS(3)

–0.3 to (VDD + 0.3) < 4

Analog input voltage

–0.3 to (VCC + 0.3) < 6.5

Input current (any pins except supplies)

±10

Ambient temperature under bias

–40 to +125

°C

Storage temperature

–55 to +150

°C

Junction temperature

+150

°C

Package temperature (IR reflow, peak)

+260

°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

Input mode or I2C mode.

(3)

Output mode except for I2C mode.

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