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641 Datasheet(PDF) 83 Page - Intel Corporation |
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641 Datasheet(HTML) 83 Page - Intel Corporation |
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83 / 106 page ![]() Datasheet 83 Thermal Specifications and Design Considerations processor temperature. Transistor Model parameters (Table 31) have been added to support thermal sensors that use the transistor equation method. The Transistor Model may provide more accurate temperature measurements when the diode ideality factor is closer to the maximum or minimum limits. This thermal "diode" is separate from the Thermal Monitor's thermal sensor and cannot be used to predict the behavior of the Thermal Monitor. When calculating a temperature based on thermal diode measurements, a number of parameters must be either measured or assumed. Most devices measure the diode ideality and assume a series resistance and ideality trim value, although some are capable of also measuring the series resistance. Calculating the temperature is then Table 30. Thermal “Diode” Parameters using Diode Model Symbol Parameter Min Typ Max Unit Notes IFW Forward Bias Current 5 — 200 µA 1 NOTES: 1. Intel does not support or recommend operation of the thermal diode under reverse bias. n Diode Ideality Factor 1.000 1.009 1.050 - 2, 3, 4 2. Characterized across a temperature range of 50 – 80 °C. 3. Not 100% tested. Specified by design characterization. 4. The ideality factor, n, represents the deviation from ideal diode behavior as exemplified by the diode equation: IFW = IS * (e qVD/nkT –1) where IS = saturation current, q = electronic charge, VD = voltage across the diode, k = Boltzmann Constant, and T = absolute temperature (Kelvin). RT Series Resistance 2.79 4.52 6.24 Ω 2, 3, 5 5. The series resistance, RT, is provided to allow for a more accurate measurement of the junction temperature. RT, as defined, includes the lands of the processor but does not include any socket resistance or board trace resistance between the socket and the external remote diode thermal sensor. RT can be used by remote diode thermal sensors with automatic series resistance cancellation to calibrate out this error term. Another application is that a temperature offset can be manually calculated and programmed into an offset register in the remote diode thermal sensors as exemplified by the equation: Terror = [RT * (N-1) * IFWmin] / [nk/q * ln N] where Terror = sensor temperature error, N = sensor current ratio, k = Boltzmann Constant, q = electronic charge. Table 31. Thermal “Diode” Parameters using Transistor Model Symbol Parameter Min Typ Max Unit Notes IFW Forward Bias Current 5 — 200 µA 1, 2 NOTES: 1. Intel does not support or recommend operation of the thermal diode under reverse bias. 2. Same as IFW in Table 30. IE Emitter Current 5 — 200 µA nQ Transistor Ideality 0.997 1.001 1.005 — 3, 4, 5 3. Characterized across a temperature range of 50 – 80 °C. 4. Not 100% tested. Specified by design characterization. 5. The ideality factor, nQ, represents the deviation from ideal transistor model behavior as exemplified by the equation for the collector current: IC = IS * (e qVBE/nQkT –1) Where IS = saturation current, q = electronic charge, VBE = voltage across the transistor base emitter junction (same nodes as VD), k = Boltzmann Constant, and T = absolute temperature (Kelvin). Beta 0.391 — 0.760 — 3, 4 RT Series Resistance 2.79 4.52 6.24 Ω 3, 6 6. The series resistance, RT, provided in the Diode Model Table (Table 30) can be used for more accurate readings as needed. |
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