641 datasheet(26/106 Pages) INTEL

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Electrical Specifications

Datasheet

ILI

Input Leakage

Current

N/A

± 200

µA

ILO

Output Leakage

Current

N/A

± 200

µA

RON

Buffer On Resistance

NOTES:

1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.

2. VIL is defined as the voltage range at a receiving agent that will be interpreted as a logical low value.

3. LINT0/INTR and LINT1/NMI use GTLREF as a reference voltage. For these two signals,

VIH = GTLREF + (0.10 * VTT) and VIL= GTLREF – (0.10 * VTT).

4. VIH is defined as the voltage range at a receiving agent that will be interpreted as a logical high value.

5. VIH and VOH may experience excursions above VTT. However, input signal drivers must comply with the signal quality

specifications.

6. The VTT referred to in these specifications refers to instantaneous VTT.

7. All outputs are open drain.

8. The maximum output current is based on maximum current handling capability of the buffer and is not specified into

the test load.

9. Leakage to VSS with land held at VTT.

10.Leakage to VTT with land held at 300 mV.

Table 12.

PWRGOOD and TAP Signal Group DC Specifications

Symbol

Parameter

Min

Max

Unit Notes1, 2

NOTES:

1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.

2. All outputs are open drain.

VHYS

Input Hysteresis

120

396

VHYS represents the amount of hysteresis, nominally centered about 0.5 * VTT, for all TAP inputs.

VT+

PWRGOOD Input low-

to-high threshold

voltage

0.5 * (VTT + VHYS_MIN

+ 0.24)

0.5 * (VTT + VHYS_MAX

+ 0.24)

4, 5

4. The VTT referred to in these specifications refers to instantaneous VTT.

5. 0.24 V is defined at 20% of nominal VTT of 1.2 V.

TAP Input low-to-high

threshold voltage

0.5 * (VTT + VHYS_MIN) 0.5 * (VTT + VHYS_MAX)

VT-

PWRGOOD Input high-

to-low threshold

voltage

0.4 * VTT

0.6 * VTT

TAP Input high-to-low

threshold voltage

0.5 * (VTT – VHYS_MAX) 0.5 * (VTT – VHYS_MIN)

VOH

Output High Voltage

N/A

VTT

4, 6

6. The TAP signal group must meet the signal quality specifications.

IOL

Output Low Current

—

22.2

7. The maximum output current is based on maximum current handling capability of the buffer and is not specified into

the test load.

ILI

Input Leakage Current

—

± 200

µA

8. Leakage to Vss with land held at VTT.

ILO

Output Leakage Current

—

± 200

µA

9. Leakage to VTT with land held at 300 mV.

RON

Buffer On Resistance

Table 11.

GTL+ Asynchronous Signal Group DC Specifications

Symbol

Parameter

Min

Max

Unit

Notes1

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