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AN4242 Datasheet(PDF) 2 Page - STMicroelectronics |
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AN4242 Datasheet(HTML) 2 Page - STMicroelectronics |
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2 / 26 page ![]() Contents AN4242 2/26 DocID024196 Rev 1 Contents 1 Features of the SiC diodes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 1.1 Turn off behavior . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 1.1.1 Comparison with Si bipolar diode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 1.1.2 Capacitive charge (QC) measurement . . . . . . . . . . . . . . . . . . . . . . . . . . 3 1.2 Forward characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 1.3 Other characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 1.3.1 Low leakage current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 1.3.2 “C” thermal coefficient . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 2 Forward thermal runaway . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2.1 Thermal runaway risk in regular working mode . . . . . . . . . . . . . . . . . . . . . 8 2.2 Thermal runaway risk in transient phase . . . . . . . . . . . . . . . . . . . . . . . . . .11 3 New 650 V JBS SiC diodes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 3.1 Device structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 3.2 Comparison between first and second generation of SiC diodes . . . . . . . 13 3.2.1 Forward voltage comparison . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 3.2.2 IFSM PSpice simulation: comparison between 1st and 2nd generation 15 3.2.3 IFSM datasheet comparison between SiC G2 and SiC G1 . . . . . . . . . . 16 3.3 JBS structure trade-off: current surge capability versus Qrr . . . . . . . . . . 17 3.3.1 Forward characteristics comparison between ST’S SiC 2nd generation and other JBS designs 17 3.3.2 No recovery charge area . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 3.3.3 PSpice electro-thermal simulation result . . . . . . . . . . . . . . . . . . . . . . . . 19 4 Efficiency measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 4.1 dI/dt optimization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 4.2 Example of efficiency measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 5 Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 6 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 |
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