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AN4242 Datasheet(PDF) 4 Page - STMicroelectronics |
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AN4242 Datasheet(HTML) 4 Page - STMicroelectronics |
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4 / 26 page ![]() Features of the SiC diodes AN4242 4/26 DocID024196 Rev 1 Figure 2. Qc measurement of a 6 A SiC diode at IF = 1 A, Tj = 25 °C, VR = 400 V, dI/dt = 50 A/µs To avoid false readings due to some measurement inaccuracy, a theoretical approach is preferred. The quantity of charge Q during a certain period of time [0-t0] is delimited by the reverse voltage variation V across the junction capacitance Cj between 0 and VR and is given by the following formulas: Equation 1 with Equation 2 Qc = 19.6 nc Qc = 24.2 nC Qc=20.4nc Voltage probe 0 t0 A. With voltage probe B. Without voltage probe C. I = 2 A, dI/dt = 200 A/µs F ò ò 0 Qc dQ = 0 t0 i(t) dt i(t) = Cj dV(t) dt |
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