KAI-4021 datasheet(23/56 Pages) ONSEMI

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KAI-4021 Image Sensor

www.truesenseimaging.com

Revision 1.1 PS-0014 Pg 23

Defect Definitions

Description

Definition

Maximum

Temperature(s) tested

at (°C)

Notes

Major dark field

defective pixel

Defect ≥148 mV

27, 40

Major bright field

defective pixel

Defect ≥ 10%

Minor dark field

defective pixel

Defect ≥ 76 mV

400

27, 40

Dead pixel

Defect ≥ 80%

27, 40

Saturated pixel

Defect ≥ 340 mV

27, 40

Cluster defect

A group of 2 to 10 contiguous major defective

pixels, but no more than 2 adjacent defects

horizontally

27, 40

Column defect

A group of more than 10 contiguous major

defective pixels along a single column

27, 40

Notes:

There will be at least two non-defective pixels separating any two major defective pixels.

DEFECT MAP

The defect map supplied with each sensor is based upon testing at an ambient (27 °C) temperature. Minor point

defects are not included in the defect map. All defective pixels are reference to pixel 1, 1 in the defect maps.

KAI-4021 Datasheet(PDF) 23 Page - ON Semiconductor

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