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KAI-4021 Datasheet(PDF) 24 Page - ON Semiconductor |
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KAI-4021 Datasheet(HTML) 24 Page - ON Semiconductor |
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24 / 56 page ![]() KAI-4021 Image Sensor www.truesenseimaging.com Revision 1.1 PS-0014 Pg 24 Test Definitions TEST REGIONS OF INTEREST Active Area ROI: Pixel (1, 1) to Pixel (2048, 2048) Center 100 by 100 ROI: Pixel (974, 974) to Pixel (1073, 1073) Only the active pixels are used for performance and defect tests. OVERCLOCKING The test system timing is configured such that the sensor is overclocked in both the vertical and horizontal directions. See Figure 16 for a pictorial representation of the regions. Figure 16: Overclock Regions of Interest Pixel 1,1 Vertical Overclock H V |
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